Bruker at IMC21

31 August – 4 September 2026

Liverpool Experience Campus, Liverpool, UK

Stand 125

 IMC21 - The 21st International Microscopy Congress

Meet Bruker at IMC21 Liverpool to discover our innovative, cutting-edge solutions for materials characterization, electron microscopy, and 3D imaging.

Visit us at the Bruker booth (no. 125) to explore our latest technologies, take part in live demonstrations, and connect with Bruker experts from around the world.

We will be showcasing our groundbreaking new technologies for ultra-fast analysis on electron microscopes, including detectors for Energy Dispersive X-ray Spectroscopy (EDS) and Electron BackScatter Diffraction (EBSD). See in person how these detectors can accelerate your analysis and make challenging applications easy in a live one-on-one demo.

Experts for our micro-CT systems, including our modular X4 POSEIDON benchtop scanner, and transmission electron microscopes will also be available to answer your questions - either drop by the Bruker booth or book a meeting ahead of time here

DEMOS

Experience our Breakthrough Detector Technology for SEM-Based Analysis

Be one of the first to experience the power of the next-generation of EBSD and EDS detectors with live, one-on-one demos at the Bruker booth (no. 125), this IMC. 

If you are not able to attend the conference we will also offer live, online demos once the conference has ended. Just select the "online" option in the form. 

 

eWARP: Enter the New Era of EBSD 

eWARP is our revolutionary EBSD detector that has been changing the EBSD landscape since its release last year. Using unique, award-winning WARP hybrid pixel sensor to deliver unprecedented analysis speeds and spatial resolution. 

 

XFlash® 7: Meet the Latest Hero of EDS 

Sign up for a demo to be one of the first to experience our revolutionary EDS detector. 

 

Meet with Bruker at IMC

Bruker will be in attendence throughout all of IMC21.

To learn more about our new and exciting breakthrough detector technology, and how it could benefit your research, visit Bruker at booth 125 throughout the exhibition

We are excited to be contributing towards the congress with a range of talks and poster presentations covering subjects including Scanning Transmission Electron Microscopy (STEM), Energy Dispersive X-ray Spectroscopy (EDS) and STEM EDS. Find the full schedule below. 

 

Meet our Experts

Our specialists will be available throughout the congress to discuss EBSD, EDS, materials characterization workflows, electron microscopy applications, Micro-CT and 3D X-ray microscopy.

Book a one-to-meeting to discuss your application in detail here. 

Exhibition Opening Times

  • Monday 31 August, 9:30 - 18-30
  • Tuesday 1 September, 9:30 - 18:30
  • Wednesday 2 September, 9:30 - 18:30
  • Thursday 3 September, 9:30 - 18:30

Poster presentations daily from 17:30 - 18:30 

Attend our Scientific Contributions at IMC21

Talks
  • Towards surface science in the STEM: recent advances in atomic resolution secondary electron imaging
    Presenter:
    Joel Martis
    Date & Time: Tuesday, 1 September | 11:05–11:20
    Symposium (Session): Surface Sensitive Microscopy, Analysis and Sample Manipulation (SEM, FIB, Helium Microscopy, LEEMS and PEEMS etc)
  • Liquid-Helium-Cooled STEM with Double-Tilting
    Presenter:
    Cameron Johnson
    Date & Time: Tuesday, 1 September | 15:45–16:15
    Symposium (Session): Innovating Microscopy End-to-End: Hardware, Automation, and AI in Honour of Albert Crewe
  • Advanced Multi-Segment EDS Detectors for High-Speed, High-Accuracy Elemental Analysis
    Presenter: Sebastian Schmidt
    Date & Time: Wednesday, 2 September | 16:00–16:15
    Symposium (Session): 1c (Auditorium) - ICMA Vendor Session
  • Plenary Lecture - Niklas Dellby (Vernon Cosslet Medal 2025)
    Presenter:
    Niklas Dellby
    Date & Time: Friday, 4 September | 10:45–11:15
    Symposium (Session): Plenary Lecture - Niklas Dellby (Vernon Cosslet Medal 2025)
Posters
  • From comparative to coincidence spectroscopies: Instrumentation for cathodoluminescence, light injection and EELS in STEM
    Presenter:
    Luiz Tizei
    Date & Time: Tuesday, 1 September | TBD
    Symposium (Session): Innovating Microscopy End-to-End: Hardware, Automation, and AI in Honour of Albert Crewe
  • Correlation of EDS and EELS Elemental Mapping: the Power of Peak Deconvolution in STEM EDS
    Presenter:
    Julien Aubourg
    Date & Time: Wednesday, 2 September | 17:30–18:30
    Location: Poster Session 3, Exhibition Hall
  • Optimizing Electron Beam and Hardware Parameters for Enhanced EDS Map Spectral Data Quality
    Presenter:
    Purvesh Soni
    Poster ID: IP3 055
    Date & Time: Wednesday, 2 September | 17:30–18:30
    Location: Poster Session 3, Exhibition Hall