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Bruker at IMC21

31 August – 4 September 2026

Liverpool Experience Campus, Liverpool, UK

Stand 125

 IMC21 - The 21st International Microscopy Congress

Meet Bruker at IMC21 Liverpool and discover innovative solutions for materials characterization, electron microscopy, and 3D imaging. Visit Stand 125 to explore our latest technologies, experience live demonstrations, and connect with Bruker experts from around the world.

Explore advanced EBSD, EDS, and 3D X-ray microscopy solutions and learn how Bruker's integrated workflows can help you gain deeper insights into your materials, accelerate innovation, and solve complex research challenges.

Register to Attend

Book Your EBSD & EDS Demo

Interested in seeing Bruker's latest EBSD and EDS technologies in action? Schedule a personal demonstration with our specialists during IMC21.

Book a Demo

Meet Our Experts

Our specialists will be available throughout the congress to discuss EBSD, EDS, materials characterization workflows, electron microscopy applications, Micro-CT and 3D X-ray microscopy.

Meet an Expert

Featured at Our Booth

eWARP EBSD Detector

Discover Bruker's latest eWARP EBSD detector, delivering exceptional speed, sensitivity, and data quality for advanced crystallographic and microstructural characterization.
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EDS Solutions for SEM

Learn how Bruker's EDS solutions provide fast and reliable elemental analysis, enabling comprehensive materials characterization and high-quality elemental mapping.
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X4 POSEIDON

Experience the X4 POSEIDON, Bruker's benchtop 3D X-ray microscope, delivering high-resolution, non-destructive imaging for research and advanced materials analysis.
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Scientific Contributions

Talks
  • Towards surface science in the STEM: recent advances in atomic resolution secondary electron imaging
    Presenter:     Joel Martis
    Date & Time: Tuesday, 1 September | 11:05–11:20
    Symposium (Session): Surface Sensitive Microscopy, Analysis and Sample Manipulation (SEM, FIB, Helium Microscopy, LEEMS and PEEMS etc)
  • Liquid-Helium-Cooled STEM with Double-Tilting
    Presenter:     Cameron Johnson
    Date & Time: Tuesday, 1 September | 15:45–16:15
    Symposium (Session): Innovating Microscopy End-to-End: Hardware, Automation, and AI in Honour of Albert Crewe
  • Plenary Lecture - Niklas Dellby (Vernon Cosslet Medal 2025)
    Presenter:     Niklas Dellby
    Date & Time: Friday, 4 September | 10:45–11:15
    Symposium (Session): Plenary Lecture - Niklas Dellby (Vernon Cosslet Medal 2025)
Posters
  • From comparative to coincidence spectroscopies: Instrumentation for cathodoluminescence, light injection and EELS in STEM
    Presenter:     Luiz Tizei
    Date & Time: Tuesday, 1 September | TBD
    Symposium (Session): Innovating Microscopy End-to-End: Hardware, Automation, and AI in Honour of Albert Crewe
  • Correlation of EDS and EELS Elemental Mapping: the Power of Peak Deconvolution in STEM EDS
    Presenter:     Julien Aubourg
    Date & Time: Wednesday, 2 September | 17:30–18:30
    Location: Poster Session 3, Exhibition Hall
  • Optimizing Electron Beam and Hardware Parameters for Enhanced EDS Map Spectral Data Quality
    Presenter:     Purvesh Soni
    Poster ID: IP3 055
    Date & Time: Wednesday, 2 September | 17:30–18:30
    Location: Poster Session 3, Exhibition Hall