WLI Optical Profilers: Measuring Profile and Real Mean Roughness with 3D Profilers
Discover the practical differences between stylus and areal methods of assessing mean roughness (Sa vs Ra), as well as the key considerations necessary for choosing and using both
Presented by Samuel Lesko, Ph.D. Dir. of Technology and Apps Development, Bruker Nano Surfaces & Metrology and Ian Armstrong, Ph.D. North America Application Manager, Bruker (April 06, 2020)