Analytical electron microscopy (EM) techniques such as energy-dispersive X-ray spectroscopy (EDS) are invaluable for studying biological samples containing minerals like calcium carbonate (CaCO₃), metal ions, or other compositions beyond carbon and oxygen. However, analyzing beam-sensitive materials can be challenging due to their low signal output and long acquisition times, often leading to sample damage and loss of the measured area. The XFlash® FlatQUAD detector was utilized to overcome these challenges, enabling the study of beam-sensitive organic materials, particularly frozen biological samples in scanning electron microscopy (SEM).
In this webinar, our guest speaker, Dr. Ifat Kaplan will present the cryo-SEM-EDS workflow, along with imaging and spectral data that reveal the distribution of metal ions during silk processing in silkworms. SEM EDS mapping under cryo-conditions reveals the composition and spatial localization of metal ions during silk evolution within the silk gland. These findings were recently published in Nature Communications.
Join us for this informative 30-minute session to learn about the exceptional performance of the XFlash® FlatQUAD, a highly sensitive EDS detector for SEM, which is optimial for chemical mapping of biological and life science specimens. Discover how this cutting-edge technology handles even the most challenging samples with unparalleled speed (10x–50x faster than conventional EDS detectors) and sensitivity, making it a top choice for SEM EDS analysts.
Dr. Purvesh Soni
Application Scientist EDS, Bruker Nano Analytics
Dr. Ifat Kaplan-Ashiri
Associate Staff Scientist, Weizmann Institute of Science
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