AFM 模式

接触模式

为原始AFM模式，提供形貌成像和通往高级技术的门户

接触模式是所有AFM技术的基础，探针针尖与样品表面保持持续的物理接触。当针尖沿表面扫描时，样品的形貌会导致悬臂梁产生垂直弯曲。反馈回路在预设载荷力下保持悬臂弯曲量，并使用反馈响应生成形貌图像。

接触模式适用于材料科学、生物应用和基础研究。该模式也为其它需要针尖与样品直接进行接触的SPM（扫描探针显微）技术奠定了基础。

RETURN TO AFM MODES LIST

天然胶原蛋白原纤维表现出典型的67nm带状图案。

Related Links

Topic Input value is invalid.

Get instant access to the full-length AFM modes handbook.

The Definitive AFM Modes Handbook contains everything you need to understand, select, and apply AFM techniques in materials research, including:

An easy-to-use framework for understanding the seven categories of AFM modes, their capabilities, and their core uses

Detailed descriptions of 50+ modes and variants (including 300+ data images)
Summary information about what each mode is, how it works, and when to use it

Our experts' top probe recommendations for each mode

First Name Please enter your first name

Last Name Please enter your last name

Email Please enter your e-mail address

Phone Please enter a valid phone number

Company/Institution Please enter your Company/Institution

Country or Area Please select your Country

State/Province Please select your State

What best describes your current interest?

Learning: Expanding my knowledge Searching: Investigating technologies for my applications Investing: Buying in one year Purchasing: Actively in the buying process

Do you have any questions about AFM modes, instruments, or applications?

By submitting this form I confirm that I would like to be contacted by Bruker. I have taken note of the Bruker Website Privacy Notice and I agree to the Terms of Use of the Bruker website. Please accept the Terms and Conditions

^{Privacy Notice Terms of Use}

^{* Please fill out the required fields.}