AFM 模式

磁力显微镜（MFM）

磁力和形貌特性同步成像

长期以来，磁性记录材料、超导体和磁性纳米颗粒等领域的研究人员对于纳米尺度下的磁力研究一直都很感兴趣。磁力显微镜（MFM）是源自 TappingMode™ 的二次成像模式，可对样品表面上方的磁力梯度进行成像，同时可获取形貌数据。

MFM基于获得专利的两遍扫描技术LiftMode™。该系统在样品表面和样品表面上方指定的提升高度交替进行线扫描，以分别测量形貌和磁力。

MFM可用于对磁性材料中天然生成或有意写入的畴结构进行成像。

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钢样品中的磁畴。

More Information

PeakForce MFM

Highest spatial resolution and sensitivity for nanoscale magnetic characterization

Application Note: PeakForce Magnetic Force Microscopy

Understand PeakForce MFM, a novel MFM variant that improves resolution, sensitivity, versatility, and sample compatibility.

Download PDF [4.8MB]

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