AFM 模式

纳米压痕和纳米划痕

纳米尺度样品的硬度和磨损测试

三种不同的受到磨损的摩擦膜，每个摩擦膜的中央都有明显的磨痕。AFM图像来自每个磨痕中心附近2um的扫描区域。

压痕是确定样品的力学性能（如硬度或模量）的常用工具。借助AFM系统上的金刚石探针，研究人员能够对体积极小的样品进行纳米压痕以获得宝贵数据。AFM还可执行纳米划痕和磨损测试，以研究薄膜的粘附力和耐用性。

布鲁克的NanoMan和NanoPlot软件包使用户可以灵活并精确地控制 SPM 探针在平面内的定位和移动，可直接、精确地操控纳米尺度物体、或进行表面压痕测试以及高清晰度纳米光刻。

RETURN TO AFM MODES LIST

Related Links

Topic Input value is invalid.

Get instant access to the full-length AFM modes handbook.

The Definitive AFM Modes Handbook contains everything you need to understand, select, and apply AFM techniques in materials research, including:

An easy-to-use framework for understanding the seven categories of AFM modes, their capabilities, and their core uses

Detailed descriptions of 50+ modes and variants (including 300+ data images)
Summary information about what each mode is, how it works, and when to use it

Our experts' top probe recommendations for each mode

First Name Please enter your first name

Last Name Please enter your last name

Email Please enter your e-mail address

Phone Please enter a valid phone number

Company/Institution Please enter your Company/Institution

Country or Area Please select your Country

State/Province Please select your State

What best describes your current interest?

Learning: Expanding my knowledge Searching: Investigating technologies for my applications Investing: Buying in one year Purchasing: Actively in the buying process

Do you have any questions about AFM modes, instruments, or applications?

By submitting this form I confirm that I would like to be contacted by Bruker. I have taken note of the Bruker Website Privacy Notice and I agree to the Terms of Use of the Bruker website. Please accept the Terms and Conditions

^{Privacy Notice Terms of Use}

^{* Please fill out the required fields.}