AFM 模式

扫描隧道显微镜（STM）

导电样品可达原子分辨率

IBM 于 1980 年代开发了扫描隧道显微镜(STM)，发明人Gerd Binnig 和 Heinrich Rohrer 因该成果荣获 1986 年诺贝尔物理学奖。该技术为后来进一步发展到原子力显微镜(AFM)奠定了基础。STM 采用隧穿电流来测量表面电子状态的形貌，其隧穿电流取决于探针针尖与样品表面之间的距离。

STM 通常用于导体和半导体表面测量。常见应用包括原子分辨率成像、扫描电化学电位显微镜(SECPM)以及对导电性不良的样品进行低电流成像。

RETURN TO AFM MODES LIST

铜在金(111)表面的欠电位沉积的原位原子分辨率电化学 STM 图像

Related Links

Topic Input value is invalid.

Get instant access to the full-length AFM modes handbook.

The Definitive AFM Modes Handbook contains everything you need to understand, select, and apply AFM techniques in materials research, including:

An easy-to-use framework for understanding the seven categories of AFM modes, their capabilities, and their core uses

Detailed descriptions of 50+ modes and variants (including 300+ data images)
Summary information about what each mode is, how it works, and when to use it

Our experts' top probe recommendations for each mode

First Name Please enter your first name

Last Name Please enter your last name

Email Please enter your e-mail address

Phone Please enter a valid phone number

Company/Institution Please enter your Company/Institution

Country or Area Please select your Country

State/Province Please select your State

What best describes your current interest?

Learning: Expanding my knowledge Searching: Investigating technologies for my applications Investing: Buying in one year Purchasing: Actively in the buying process

Do you have any questions about AFM modes, instruments, or applications?

By submitting this form I confirm that I would like to be contacted by Bruker. I have taken note of the Bruker Website Privacy Notice and I agree to the Terms of Use of the Bruker website. Please accept the Terms and Conditions

^{Privacy Notice Terms of Use}

^{* Please fill out the required fields.}