To perform a non-destructive analysis of glass in its final state or metallic coatings, or to perform an analysis of the spatial distribution of particular elements of interest, the Micro-XRF technology such as the M4 TORNADO, the M4 TORNADOPLUS or the QUANTAX Micro-XRF for SEM are well suited analysis methods.
If higher spatial resolution is required, scanning and transmission electron microscopes (SEM and TEM) provide extremely high resolution and the opportunity to use the Bruker QUANTAX system to perform energy dispersive spectrometry (EDS) for inorganic material analysis. Using the XSense wavelength-dispersive spectrometer, challenging materials in the low energy or light element range can be better determined due to its excellent energy resolution and light element sensitivity. Using the SEM based QUANTAX EBSD (electron backscattered diffraction) system, crystal orientation maps can be acquired to understand the crystallography and phase boundaries, and study deformations in materials.