AFM Modes

PeakForce SECM

AFM-based scanning electrochemical microscopy

Finally — A Complete SECM Solution

Bruker’s exclusive PeakForce SECM™ mode is the world’s first complete commercial solution for AFM-based scanning electrochemical microscopy (SECM). With a spatial resolution less than 100 nanometers, PeakForce SECM™ uniquely provides simultaneous capture of topographical, electrochemical, electrical, and mechanical maps with nanoscale lateral resolution. This technology radically redefines what is possible in the nanoscale visualization of electrical and chemical processes in liquid.

Acquire previously unattainable electrochemical information

(A) 3D topography of a nanomesh electrode (Au-SiO2) covered by EC current skin; (B) line profiles of the topographic and EC variations on the Au-SiO2 surface in (A); and (C) line profiles of the topographic and EC variations from a nanoelectrode array sample. Nanomesh electrode sample courtesy of C. Stelling and M. Retsch, University of Bayreuth. Image courtesy of A. Mark and S. Gödrich, University of Bayreuth. Nanoelectrode array sample courtesy of M. Nellist and Prof. S. Boettcher, University of Oregon.

PeakForce SECM dramatically improves, by orders of magnitude, the resolving power over traditional approaches. This accelerates research into energy storage systems (e.g., Li-ion batteries), corrosion science and biosensors, opening the door to novel measurements on individual nanoparticles, nanophases, and nanopores.

Perform simultaneous electrochemical, electrical, and mechanical mapping in liquid

PeakForce SECM images of micro-contact printed CH3-thiol self-assembled monolayer (SAM) on an Au substrate: (A) topography variations are <1 nm; (B) PeakForce QNM adhesion force; and (C) electrochemical activity at a lift height of 40 nm. (B) and (C) show quantitatively 700 pN and 108 pA differences in adhesion force and electrochemical current, respectively, between the Au and SAM regions. Image courtesy of A. Mark and S. Gödrich, University of Bayreuth.

PeakForce SECM, powered by Bruker's exclusive PeakForce Tapping technology, uniquely provides simultaneous multidimensional data. Only PeakForce SECM allows correlation of biological, chemical and physical properties with morphological structures at the nanoscale.

Benefit from reliable, easy-to-use probes specifically designed for SECM

(A) Bruker’s exclusive premounted PeakForce SECM probes offer easy and safe handling, as well as extremely stable performance over hours of imaging and multiple cleaning cycles. (B) SEM images of the probe; (C) COMSOL simulation of 10 mM [Ru(NH3)6]3+ profile; (D) 1st, 25th, and 50th CVs selected from 50 continuous scans at a scan rate of 20 mV/s; (E) 2-hour amperometric test at -0.1 V versus AgQRE, inset magnification from 70 to 120 min.; and (F) simulated (dashed lines) and experimental (solid lines) approaching curves. C and E images courtesy of C. Xiang and Y. Chen, Caltech.

Bruker's premounted PeakForce SECM probes offer easy and safe handling, and the optimized holder delivers an electrically stable architecture for sensitive signal processing. Extremely stable probe performance has been demonstrated for over 10 hours of EC testing and multiple reuse cleaning cycles.