QUANTAX Compact30 is an ideal EDS system specially designed for the COXEM EM-30 scanning electron microscope. QUANTAX Compact30 consists of a XFlash® silicon drift detector (SDD) with the best energy resolution in its field, a small electronics unit and the easy-to-use ESPRIT Compact software. The customized XFlash® SDD fits within the microscope chassis without compromising its performance and footprint.
The system performs qualitative and quantitative analyses of all materials with an element range from boron (5) to californium (98). Besides composition analysis at individual spots on the sample surface, QUANTAX Compact30 provides powerful line scan and spectral element mapping functions to complete the analysis and reporting within seconds. Furthermore, the HyperMap functionality keeps all raw data saved for later post processing on any computer.