QUANTAX Compact30

The EDS system for COXEM EM-30 SEM

QUANTAX Compact30 is an ideal EDS system specially designed for the COXEM EM-30 scanning electron microscope. QUANTAX Compact30 consists of a XFlash^® silicon drift detector (SDD) with the best energy resolution in its field, a small electronics unit and the easy-to-use ESPRIT Compact software. The customized XFlash^® SDD fits within the microscope chassis without compromising its performance and footprint.

The system performs qualitative and quantitative analyses of all materials with an element range from boron (5) to californium (98). Besides composition analysis at individual spots on the sample surface, QUANTAX Compact30 provides powerful line scan and spectral element mapping functions to complete the analysis and reporting within seconds. Furthermore, the HyperMap functionality keeps all raw data saved for later post processing on any computer.

XFlash silicon drift detector

ESPRIT Compact software with mapping, report, line scan, and spectrum (from left to right).

Key features

High resolution data acquisition
Three different analysis modes: Objects, LineScan and Mapping
Automatic/interactive element identification starting from boron (5)
Accurate element quantification during acquisition
Display of quantitative results as atomic, weight or oxide percentage
Color-coded concentration distributions (element maps) for any number of elements within an arbitrary field of view including a unique live peak separation and background removal
Report generation and print formatting
Export of results to MS^® Word and Excel
Language options: English, German, Spanish, French, Russian, Chinese, Japanese