Bruker’s patented Tapping AFM-IR mode is the most advanced development in nanoscale IR technology, providing the highest spatial resolution for chemical imaging, enabling monolayer measurement sensitivity and extends the applications of nanoIR to a broader range of samples.
By extending our patented Resonance Enhanced AFM-IR technique to include tapping mode operation, Tapping AFM-IR extends the boundaries of performance for nanoscale IR spectroscopy. Additionally, the combination of Tapping AFM-IR and patented FASTspectra capability provides users with the most advanced, highest performance nanoscale IR spectroscopy capability with direct correlation to FTIR libraries:
High-resolution, high-sensitivity Tapping AFM-IR has patented features that enhance the resolution of measurement to resolve chemical features down to 10nm. For many applications, Tapping AFM-IR is now only limited by the resolution of the probe. Resonance enhanced AFM-IR has continually demonstrated monolayer sensitivity to enable chemical analysis on the thinnest of surface layers.
Tapping AFM-IR improves typical chemical imaging speed by 10x without loss of performance, so you can achieve high-resolution imaging faster or choose to take more data in the same amount time.
The combination of Tapping AFM-IR and FASTspectra provide the highest performance available for nanoscale IR Spectroscopy, extending the boundary to make new discoveries. FASTspectra AFM-IR based spectroscopy is simply the most powerful nanoscale IR spectroscopy capability available. It has excellent spectral resolution and high sensitivity, delivering rich detailed spectra that directly correlate to transmission based FTIR.
Tapping AFM-IR addresses a broad range of material types, and extends capabilities beyond those most suited by contact mode. New research possibilities are now available in a wide range of areas, such as life sciences, nanoparticles and soft polymer materials due to its softer measurement approach.