Nanomechanical Test System

Hysitron TS 77 Select

Essential toolkit for quantitative nanoscale-to-microscale mechanical and tribological characterization
Hysitron TS 77 Select

Lo más destacado

Nanomechanical & Nanotribological Test System

Hysitron TS 77 Select Nanoindenter

The Hysitron TS 77 Select automated benchtop nanomechanical and nanotribological test system provides the highest level of performance, functionality, and accessibility of any instrument in its class. Built around Bruker’s renowned TriboScope capacitive transducer technology, this new test system delivers reliable mechanical and tribological characterization over nanometer-to-micrometer length scales. Supporting the most prominent testing modes, the TS Select is an affordable entry into quantitative nanoindentation, dynamic nanoindentation, nanoscratch, nanowear, and high-resolution mechanical property mapping.

Essential
suite of core testing techniques
Includes nanoindentation, dynamic nanoindentation, nanoscratch, nanowear, and in-situ SPM imaging.
Proven
capacitive transducer technology
Delivers high sensitivity with low thermal drift for reliable mechanical characterization over nanometer-to-micrometer length scales.
Intuitive
control software and operation
Enables reliable measurements by technician-level operators.

Características

TS 77 Select Design

  1. Color optics
  2. Sample chuck
  3. Anti-vibration
  4. Environmental enclosure
  5. Piezo scanner
  6. Capacitive transducer
  7. Sample translation staging
  8. Granite frame

TS 77 Select testing modes: Your essential toolkit

Nanoindentation - High-Precision Mechanical Characterization

Characterize the elastic modulus, hardness, creep, stress relaxation, and fracture toughness of localized microstructures, interfaces, small surface features, and thin films.

In-Situ SPM Imaging - Enabling Superior Nanomechanics

Utilizes the same probe to raster the sample surface for topography imaging as it does to conduct the nanomechanical test, ensuring superior nanomechanical characterization results, data reliability, and nanometer precision test placement accuracy.

Mechanical Property Mapping - High-Speed Mapping and Fast Data Acquisition

Delivers high-speed testing capabilities, up to 180x faster than traditional nanoindentation measurements. At two nanoindentation tests per second, high-resolution mechanical property maps of inhomogeneous materials can be obtained within minutes.

Wear Testing - Quantitative Nanoscale Wear Resistance

Quantitative wear volumes and wear removal rates can be measured as a function of applied contact force, sliding speed, and number of passes. Due to the scale of testing, tribological performance of individual microstructures, interfaces, and thin films can readily be measured.

Hysitron TS Select Options

Dynamic Nanoindentation - Depth Profiling, Viscoelastic Properties

Dynamic nanoindentation superimposes a small oscillatory force over a quasi-static force component to obtain a continuous measurement of hardness and modulus as a function of depth into a material’s surface. The dynamic nanoindentation option includes a capacitive transducer optimized for dynamic measurements and controller electronics to deliver superior results as a function of testing depth, frequency, and time.

Nanoscratch - Friction, Mar Resistance, and Thin Film Adhesion

Nanoscratch utilizes an electrostatically actuated two-dimensional transducer to apply a normal force in a controlled fashion while simultaneously measuring the force required to move the tip laterally across the sample surface. The nanoscratch option does not rely on motorized staging for lateral movement, providing the most sensitive and reliable nanoscale friction and thin film adhesion measurements in the market.

Software

TS 77 Select Control Software

Streamlined system operation and data analysis

Bruker’s TS Select control and analysis software package was specifically developed to simplify the measurement process; from loading samples and test set-up to measurement execution and data analysis. TS Select control software incorporates automated sample testing and instrument calibration routines for simple, highthroughput, and mistake-free characterization.

Más información

Contacto con un experto

Contact Us

* Please fill out the mandatory fields.

Please enter your first name
Please enter your last name
Please enter your e-mail address
Please enter your Company/Institution
What best describes your current interest?
Please add me to your email subscription list so I can receive webinar invitations, product announcements and events near me.
Please accept the Terms and Conditions

Este sitio está protegido por reCAPTCHA y se aplican la Política de privacidad y las Condiciones del servicio de Google.