The Hysitron TS 77 Select automated benchtop nanomechanical and nanotribological test system provides the highest level of performance, functionality, and accessibility of any instrument in its class. Built around Bruker’s renowned TriboScope capacitive transducer technology, this new test system delivers reliable mechanical and tribological characterization over nanometer-to-micrometer length scales. Supporting the most prominent testing modes, the TS Select is an affordable entry into quantitative nanoindentation, dynamic nanoindentation, nanoscratch, nanowear, and high-resolution mechanical property mapping.
Characterize the elastic modulus, hardness, creep, stress relaxation, and fracture toughness of localized microstructures, interfaces, small surface features, and thin films.
Utilizes the same probe to raster the sample surface for topography imaging as it does to conduct the nanomechanical test, ensuring superior nanomechanical characterization results, data reliability, and nanometer precision test placement accuracy.
Delivers high-speed testing capabilities, up to 180x faster than traditional nanoindentation measurements. At two nanoindentation tests per second, high-resolution mechanical property maps of inhomogeneous materials can be obtained within minutes.
Quantitative wear volumes and wear removal rates can be measured as a function of applied contact force, sliding speed, and number of passes. Due to the scale of testing, tribological performance of individual microstructures, interfaces, and thin films can readily be measured.
Dynamic nanoindentation superimposes a small oscillatory force over a quasi-static force component to obtain a continuous measurement of hardness and modulus as a function of depth into a material’s surface. The dynamic nanoindentation option includes a capacitive transducer optimized for dynamic measurements and controller electronics to deliver superior results as a function of testing depth, frequency, and time.
Nanoscratch utilizes an electrostatically actuated two-dimensional transducer to apply a normal force in a controlled fashion while simultaneously measuring the force required to move the tip laterally across the sample surface. The nanoscratch option does not rely on motorized staging for lateral movement, providing the most sensitive and reliable nanoscale friction and thin film adhesion measurements in the market.
Bruker’s TS Select control and analysis software package was specifically developed to simplify the measurement process; from loading samples and test set-up to measurement execution and data analysis. TS Select control software incorporates automated sample testing and instrument calibration routines for simple, highthroughput, and mistake-free characterization.