Atomic Force Microscope

Dimension FastScan

First-and-only no-compromise high-speed AFM

Dimension FastScan

The Dimension FastScan® atomic force microscope (AFM) system is specifically designed to scan fast without loss of resolution, loss of force control, added complexity, or additional operating costs. With FastScan you achieve immediate AFM images with the expected high resolution of a high-performance AFM. Whether you scan at >125Hz when surveying a sample to find the region of interest, or at time rates of 1-second per image frame in air or fluid, FastScan redefines the AFM experience.

high-speed performance
Delivers highest resolution any time, every time, independent of sample size.
nanoscale dynamics
Provide ultimate tip-scanning speed and stability for direct visualization of dynamic behavior in air or fluid.
setup, data acquisition, and analysis
Makes system operation surprisingly simple while enhancing productivity, allowing you to focus on your research.

Benchmark for High Speed and High Resolution

Dimension FastScan is the first-and-only high-speed tip-scanning system that achieves frames per second scan rates without compromising resolution or system performance – independent of sample size. No other high-speed AFM has the large sample access of the FastScan. Coupled with PeakForce Tapping®, the system achieves instantaneous force measurement with a linear control loop, allowing point defect dimensional and mechanical resolution, and not just on hard, flat crystals.

Point defect resolution stiffness image of calcite. 15 nm image size (Panel 1). Submolecular resolution adhesion image of iPMMA film. 100 nm image size (Panel 2). Sample courtesy of Prof. Dr. Thurn-Albrecht, Martin-Luther-Universität Halle-Wittenberg.

Exceptional Productivity

Completely unattended, automated, fully self-optimizing imaging of six different samples within ten minutes, yielding publication-quality results in each case.

Every facet of the Dimension FastScan — from wide-open tip and sample access to preconfigured software settings — has been specifically engineered for trouble-free, surprisingly simple operation. Fast sample navigation, fast engaging, fast scanning, low-noise, less than 200 pm per minute of drift rate over hours, an expanded intuitive user interface, and the world-renowned Dimension platform combine to deliver an entirely new experience in AFM, while ensuring high-quality data with faster time to results and publication. FastScan users can achieve immediate high-quality results without the usual hours of expert tweaking.

More Applications and New Insights Faster

Sample surveying is a common way to explore unknown samples to understand heterogeneity, unique feature characteristics, and mechanical properties. Here are the results of a FastScan sample survey, which produced a set of high-quality images ranging from high-resolution topography images of a 20 μm area to subsections 10 times smaller than the original scan. The results from one 8 minute scan are 16 megapixels of data in multiple channels, where high-resolution data is observed with clarity.

Investigate forces driving wetting and de-wetting on polystyrene films (<100nm thick) on hydrophobically treated silicon surfaces.
Amorphous drug formulations study, capturing 60 sites in 60 minutes. Samples courtesy M. E. Lauer, O. Grassmann, F. Hoffmann-LaRoche, Basel, Switzerland.

Powered by the NanoScope 6 AFM Controller

Featuring higher speeds, lower noise, and greater AFM mode flexibility, the NanoScope 6 controller allows users to harness the full potential of our high-performance Dimension and MultiMode AFM systems. This latest generation controller provides unprecedented accuracy, precision, and versatility for nanoscale surface measurements in every application.

NanoScope 6 uniquely enables Bruker AFMs to:

  • Operate in more imaging modes than is possible with competing systems, including unique and advanced AFM modes that require complex control and analysis;
  • Collect accurate, quantitative data for nanoelectrical and nanomechanical property measurements in every application; and
  • Optimize and customize scanning parameters to meet even the most demanding research and industry measurement requirements.
AFM Modes

Expand Your Applications with AFM Modes

With an unrivalled suite of imaging modes available, Bruker has an AFM technique for every investigation.

Built on the backbone of core imaging modes—Contact Mode and Tapping Mode—Bruker offers AFM modes that allow users to probe their samples’ electrical, magnetic, or materials properties. Bruker’s innovative new PeakForce Tapping technology represents a new core imaging paradigm that has been incorporated into several modes, providing topographic, electrical, and mechanical properties data in parallel.


Hear What Our Customers Have to Say

We have been using the Bruker Fastscan AFM for more than two years.  In our experience, Fastscan images four to five times faster without degrading resolution compared to other AFMs.  In addition, ScanAsyst mode with intelligent auto scan parameter adjustment enables us to quickly scan many samples with ease.  The superior Fastscan AFM performance has advanced our group’s reputation with many publications in DNA nanotechnology research.

Dr. Shou-Jun Xiao, Nanjing University, Nanjing China

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