Developments in energy dispersive X-ray spectrometry (EDS) on scanning electron microscopes (SEM) have broadened the range of possible applications. Specifically, it is possible to scan and analyze statistically significant numbers of particles over large sample areas. Such analytical information is important in a range of applications, like filter analysis, asbestos identification, steel inclusions, mineral studies, gunshot residue, geoscience, mineralogy and mining. The automated feature analysis combines the ability to quickly perform a morphological characterization with chemical analysis. Over 30 different morphological properties are used to identify various particles, which can be filtered. Either all of them or a specific subset can be subsequently chemically (elementally) analyzed and classified and grouped based on their composition.
A Q&A session will be held at the end of the webinar.
Application Scientist, Bruker Nano Analytics
Dr. Andrew Menzies
Senior Application Scientist Geology and Mining, Bruker Nano Analytics