SCANNING TRANSMISSION ELECTRON MICROSCOPE (STEM)

Nion HERMES

Ultra-High Energy Resolution Monochromated EELS STEM

Highlights

  • Better than 5 meV energy resolution
  • High brightness cold field emission gun (CFEG)
  • Dispersing-undispersing monochromator
  • Open-source Python-powered control software
  • UHV construction
  • Ultra-stable Electron Energy Loss Spectroscopy (EELS) with direct-detection option
S(q, w) diagram of phonon dispersion curves in hexagonal Boron Nitride at two different temperatures (parallel acquisition)

Nion HERMES Specifications

FeatureBenefit
< 5 meV energy resolution at 30 kV (< 6 meV at 60 kV)Resolve fine differences in EELS spectral edges
Large energy range of up to 2 keV at 200 kVCollect all elements in one EELS spectrum
Correction of all fifth-order axial aberrationsLarger probe angles, higher beam current
Every operation can be performed remotelyRemote operation with no local assistance
Friction-free, centro-symmetric sample stageUltra-precise sample motion, freedom from drift
Double tilt sample holder using ball bearingsBacklash-free, ultra-precise tilting
Fast electrostatic beam blankerAvoids sample damage when not collecting data
5th-order-corrected EELS optics>50 mr acceptance semi-angles, more efficient analysis
Microscope column is entirely ion-pumpedMinimizes sample contamination and etching
Column uses only metal vacuum sealsSample vacuum typically <1x10-9 torr
Whole column bakeable to 140°CMinimizes sensitivity to stray AC fields
Double μ-metal shielding of entire columnColumn can be reconfigured after installation
Self-diagnosing electronicsRapid remote servicing

Service & Support

Contact