Electron Microscopes
Ultra-stable Scanning Transmission Electron Microscopes (STEMs)
Bruker's line of Nion scanning transmission electron microscopes light up a world of possibilities in materials research. These cutting-edge instruments enable scientists and engineers to explore sample structures at the atomic scale and probe into atomic interactions in four dimensions. Featuring Python-powered open-source software, our STEMs have been designed from the ground up to enable a new generation of experiments.
Electron Energy Loss Spectroscopy (EELS)
Electron Energy Loss Spectroscopy (EELS) measures the energy loss of the fast-beam electrons that have passed through the sample. For a scanned beam, this generates a spectrum from each point on the sample and can be used to generate an elemental map at atomic resolution using the characteristic loss edges for each element. The electronic structure of the sample can be probed, including the band gap and chemical shifts due to different bonding environments. Nion HERMES also makes it possible to probe the vibrational properties of molecules, and phonons in crystals containing interfaces and defects, at near-atomic resolution.
Nion ULTRASTEM
With a range of operating voltages between 30 and 200 kV, the Nion ULTRASTEM uses a high-brightness, high-stability cold field emission electron gun (CFEG) that allows higher resolution, higher probe current providing sub-Angstrom resolution imaging, fast nanoanalysis with an atom-sized electron probe, and efficient coupling to a variety of detectors.
Nion HERMES
Bruker’s Nion High Energy Resolution Monochromated EELS STEM, HERMES, combines a high brightness cold field emission gun (CFEG) with a state-of-the-art monochromator and Electron Energy Loss Spectroscopy (EELS) to enable atomic resolution imaging, chemical mapping, 4D-STEM, and vibrational spectroscopy in the electron microscope at the highest level.
Nion ULTRASTEM
Nion HERMES
