SEM PicoIndenter Series

Hysitron PI Envision SEM Picoindenter

Extended value and capabilities for in-situ nanomechanical testing

Hysitron PI Envision SEM PicoIndenter

Hysitron PI Envision is a leading-edge nanomechanical testing instrument designed for in-situ operation in standard SEMs, FIB-SEMs, small-chamber SEMs, and even synchrotron beamlines. Its sub-nanometer displacement and sub-micronewton resolution make it suitable for analyzing materials from soft polymers to high strength metals and alloys. This modular platform is highly upgradeable, supporting a powerful suite of techniques, including nanoindentation, property mapping, and high-temperature testing up to 800°C. PI Envision delivers best-in-class versatility, precision, and value ideal for multi-user facilities and budget-conscious laboratories.

Upgradeable 
modular platform
Offers experiment flexibility in a variety of microscopy environments
Extended
force options up to 250 mN and displacement up to 100 µm
Provides testing capabilities for materials from soft polymers to hard ceramics
Best-in-Class 
precision and versatility
Delivers superior functionality and value for in-situ nanomechanical testing
Features

Affordable, Reliable, Upgradeable, and Easy to Use

Hysitron PI Envision is an easily upgradeable platform that offers a powerful suite of in-situ testing techniques. It is an indispensable, affordable, and reliable SEM accessory for nanomechanical and nanotribological testing.

PI Envision delivers:

  • Intrinsic displacement control, intrinsic load control, and open loop nanomechanical testing for a wide range of materials
  • Advanced upgrades for performing nanotribology, property mapping, and high-temperature testing to 800°C
  • Encoded stage control and 78 kHz feedback rate for fast, repeatable results from indentation, compression, tension, or fatigue testing

Essential Ease-of-Use Features 

PI Envision is designed to streamline your work, with:

  • An encoded stage to ensure precise sample positioning
  • Positioning travel of 12x12 mm to provide easy sample access
  • No-stitch property mapping for >1 mm x >1 mm area
  • Two sample mounts to reduce manual sample changes
Dual sample mount stage on PI Envision

Configure Your System

All PI Envision configurations deliver intrinsic displacement actuation and control with sub-nanometer resolution, feedback rate of 78 kHz, and data acquisition up to 39 kHz.

The base system supports up to 10 mN force and sub-nanometer to 5 µm displacement range, making it an excellent choice for routine indentation, compression, and tensile testing of low-hardness to medium-hardness materials.

An optional xR transducer extends the maximum load to 250 mN and displacement range up to 100 µm, making it ideal for high-hardness materials and nanotribology.

Load-displacement curve collected using PI Envision with high-load transducer option

Additional testing capabilities:

Additional testing capabilities include:

  • Push-to-Pull (PTP) Tensile Testing  Uniquely simplifies tensile testing of nanostructures such as nanotubes, nanofibers, nanowires, and thin films
  • Electrical PTP Tensile Testing — Enhances PTP testing with integrated four-point electrical measurements to study electromechanical coupling
  • Electrical Characterization — Monitors changes in electrical properties during mechanical deformation; applicable to piezoelectric and other functional materials
  • nanoDynamic Testing — Applies oscillatory forces to continuously evaluate viscoelastic and fatigue properties at room and elevated temperatures

Key features and specs of PI Envision and PI 89

  PI Envision PI 89
Max transducer force (mN) 250 mN 3500 mN
Max transducer displacement 100 µm 150 µm
Stage travel (X, Y and Z), Y = indentation direction 12, 16, 12 26, 29, 12
Sample position (XY) 12 mm x 12 mm 12 mm x 26 mm
Multi-Sample mounting compatibility 2 samples 6 samples
Property mapping area 12 mm x 12 mm 12 mm x 26 mm
High temperature 800°C 800°C and 1000°C
Rotation and tilt stage (5 deg of freedom for in-situ correlative characterization) No Yes
Cryogenic temp Not available -130°C (possible to reach well below -130°C depending on the sample size and SEM chamber)
nanoTribology Yes Yes
Push-to-Pull and Electrical; Push-to-Pull Yes Yes
NanoDynamic, Fatigue Yes (room temperature and high temperature) Yes (room temperature, high temperature and cryogenic temperature)
Electrical characterization  Yes Yes
  DOWNLOAD THE BROCHURE TO SEE FULL SYSTEM SPECIFICATIONS  
Software

Analyze Your Data

Hysitron nanomechanical test instruments come standard with Tribo iQ, Bruker’s complete data processing, graphic, and reporting solution. Tribo iQ encompasses a suite of technique-specific software applications that simplify and streamline the experiment-analysis loop.

Contact Expert

Contact Us About the Hysitron PI Envision SEM PicoIndenter

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