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カタログ & データシート

Contour GT-X - Datasheet 1.7 MB

Bruker's ContourGT-X 3D optical microscope offers advanced features for quick, automated analysis of surface characteristics for research and production environments.

 

ContourGT Objectives Chart - Datasheet 188 kB

Imaging specifications on both standard and high-resolution cameras for Bruker’s Turret Mountable Standard Objective Series and Non- Turret Mountable Objectives, which include long-working-distance (LWD), through-transmissive media (TTM), and low-magnification objectives.

 

AcuityXR Enhanced-Resolution Microscopy Technology 1.1 MB

AcuityXR™ is a revolutionary optical surface profiler measurement capability that combines unique, patent-pending, Bruker hardware and software technology to enable select ContourGT® Non-Contact, 3D Optical Surface Profilers to break the optical diffraction limit and deliver lateral resolutions previously considered unattainable with conventional optical microscopy techniques.

アプリケーションノート

This application note discusses the manufacture and production of various contact lenses and intraocular implantable lenses (IOLs) and how properly deployed metrology, using advanced 3D optical microscopes provide a high return on investment to manufacturers in this space.

 

AcuityXR Technology Significantly Enhances Lateral 1.9 MB

This application note details Bruker’s development of an interferometric measurement mode, AcuityXR™, that effectively overcomes the optical diffraction limit, resolving greater detail in many surfaces without compromising the many other benefits of white light interferometry.

 

Accurate Thick Film Measurement with Optical Profiling 5.9 MB

Learn how 3D optical microscopes can accurately measure transparent and semi-transparent films for the semiconductor, MEMS, and hybrid circuit markets.

 

Greater Measurement Detail with High-Definition Vertical Scanning Interferometry - App Note 5.5 MB

Bruker's high-definition vertical scanning interferometry (HDVSI) mode utilizes an innovative algorithm to deliver sub-nanometer precision on a wide range of surfaces.

 

Comparing 3D Optical Microscopy Techniques for Metrology Applications-App Note 1.6 MB

This applications note investigates the principle of operation for white light interferometry (WLI) and confocal microscopy, also known as laser scanning confocal microscopy (LSCM) and their different advantages and disadvantages.