• Dimension XR Scanning Probe Microscopes Brochure 2.5MB
Extreme Research Systems for Nanomechanics, Nanoelectrical, and Nanelectrochemistry
• PeakForce Tapping Brochure 2.7MB
Bruker’s exclusive PeakForce Tapping® is the most significant scientific breakthrough in atomic force microscope (AFM) technology since the introduction of TappingMode™. It provides unprecedented high resolution imaging, extends AFM measurements into a range of samples not previously accessed and uniquely enables simultaneous nanoscale property mapping.
• PeakForce SECM - Brochure 1.64MB
Bruker’s exclusive PeakForce SECM™ mode is the world’s first complete commercial solution for AFM-based scanning electrochemical microscopy (SECM). With a spatial resolution less than 100 nanometers, PeakForce SECM™ uniquely provides simultaneous capture of topographical, electrochemical, electrical, and mechanical maps with nanoscale lateral resolution.