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カタログ & データシート

MultiMode 8-HR - Brochure 763kB
The MultiMode® platform’s success is based on its combination of superior resolution, performance, and unparalleled versatility and productivity. The new MultiMode 8-HR™ AFM takes full advantage of these developments to provide significant improvements in imaging speed, resolution, and nanomechanical performance with higher speed PeakForce Tapping®, enhanced PeakForce QNM®, new FastForce Volume™, and exclusive Bruker probes technology.


• PeakForce Tapping Brochure 763kB

Bruker’s exclusive PeakForce Tapping® is the most significant scientific breakthrough in atomic force microscope (AFM) technology since the introduction of TappingMode™. It provides unprecedented high resolution imaging, extends AFM measurements into a range of samples not previously accessed and uniquely enables simultaneous nanoscale property mapping.


PeakForce QNM - Brochure 586kB
PeakForce Quantitative Nanomechanical Property Mapping is a groundbreaking imaging mode that provides AFM researchers unprecedented capability to quantitatively characterize nanoscale materials.

Atomic Force Microscopy Environmental Control 1-ppm Turnkey Solutions AFM - Datasheet 1.3MB
Bruker’s Environmental Control packages for atomic force microscopes enable a wide range of new AFM research.


 Imaging of the DNA Double Helix with PeakForce Tapping Mode Atomic Force Microscopy - AN-142 2.0MB

Recent advances in AFM have made the study of DNA structures more achievable. In particular, Bruker’s exclusive PeakForce Tapping® technology has enabled routine high-resolution imaging of the DNA double helix at quantifiable imaging forces, without the need for specialized probes or restrictive AFM designs.


Boise State Students Perform Unique DNA Project - CS502 2.0MB
As part of a project involving the manipulation and control of matter at the nanoscale, Boise State University researchers created a nanoscale logo from DNA, and Bruker’s MultiMode® 8 and Dimension FastScan® were part of the team

PeakForce Kelvin Probe Force Microscopy - AN140 3.5MB
Kelvin probe force microscopy (KPFM), also called surface potential microscopy, has found broad applications, ranging from corrosion studies of alloys, photovoltaic effects on solar cells, and surface analysis. KPFM, together with conductive AFM, have been recognized as the two most used nanoscale electrical characterization tools, complementing each other.

Quantitative Mechanical Property Mapping at the Nanoscale with Peak Force QNM - AN128 1.3MB
The scanning probe microscope (SPM) has long been recognized as a useful tool for measuring mechanical properties of materials. Until recently though, it has been impossible to achieve truly quantitative material property mapping with the resolution and convenience demanded by SPM researchers. A number of recent SPM mode innovations have taken aim at these limitations, and now, with the release of PeakForce QNM®, it is possible to identify material variations unambiguously and at high resolution across a topographic image. This application note discusses the principles and benefits of the PeakForce QNM imaging mode.

Simultaneous Electrical and Mechanical Property Mapping at the Nanoscale with Peak Force TUNA AFM - AN132 6.7MB
This application note discusses the basics of PeakForce TUNA, compares it to standard Contact Mode–based TUNA, and provides data demonstrating the unique capabilities and differentiated applications enabled through the combination of PeakForce Tapping and AFM conductivity measurement.