 
     
    The focus of the 2022 AFM User Meeting was the use of AFM for high-resolution imaging and the nanochemical, nanomechanical, and nanoelectrical characterization of advanced materials used in semiconductor and nanomaterials research.
The meeting includes two sessions — each with a different focus — comprised of a series of talks, live Q&A sessions, and technical demonstrations of cutting-edge Bruker AFM instruments, including the new Dimension IconIR AFM.
Our speakers discuss their latest research with AFMs and cover topics as varied as
| Length | Topic | Speaker(s) | 
|---|---|---|
| 5 minutes | Welcome/Introduction | Dr. Peter De Wolf, Worldwide Application Director, Bruker Nano Surfaces & Metrology | 
| 15 minutes | Latest Bruker AFM Developments | Dr. Mickael Febvre, Application Manager Europe, Bruker | 
| Length | Topic | Speaker(s) | Abstract | 
|---|---|---|---|
| 25 minutes | Nanoscale Electrical Characterisation of Nitride Transistor | Prof. Rachel Oliver, University of Cambridge, UK | Read More | 
| 20 minutes | Direct Observations of Mineral-Fluid Reactions using Atomic Force Microscopy | Dr. Encarnación Ruiz Agudo, University of Granada, Spain | Read More | 
| 20 minutes | Analysis of Fuel Cell and Electrolyzer Components with Nanoelectrical and Nanomechanical AFM | Dr. Tobias Morawietz, German Aerospace Center (DLR), Germany | Read More | 
| 15 minutes | Live Bruker AFM Demonstration | Dr. Vishal Panchal, Application Scientist, Bruker | 
| Length | Topic | Speaker(s) | Abstract | 
|---|---|---|---|
| 25 minutes | AFM-IR Insights into the Nanoscale Polymer Interphase | Dr. Suzanne Morsch, University of Manchester, UK | Read More | 
| 20 minutes | The Use of AFM Electrical Modes (SCM, SSRM and sMIM) in the Characterization of Dies and Semiconductor Materials | Dr. Rosine Coq Germanicus, ENSICAEN Research Center, France | Read More | 
| 15 minutes | Mechanical Mapping of Lignocellulosic Surfaces | Dr. Claudia Gusenbauer, University of Natural Resources and Life Sciences, Austria | Read More | 
| 10 minutes | Bruker Demonstration: Dimension IconIR | Dr. Miriam Unger, Application Manager, Bruker | |
| 5 minutes | Q&A and Closing | Dr. Peter De Wolf, Worldwide Application Director, Bruker Nano Surfaces & Metrology |