Dimension FastScan

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Achieve the Highest Resolution — Any Time, Every Time

FastScan and PeakForce Tapping® couple an instantaneous force measurement with a linear control loop.

Plasmid DNA strand immobilized on mica using low (5 mM) NiCl2 concentration. Major groove, minor groove, and the right-handedness of the helix are clearly visible along the entire strand.LINK







Routinely achieve DNA minor groove resolution.







Point defect dimensional and mechanical resolution — and not just on hard, flat crystals.

Point defect resolution stiffness image of calcite. 15 nm image size (Panel 1). Submolecular resolution adhesion image of iPMMA film. 100 nm image size (Panel 2). Sample courtesy of Prof. Dr. Thurn-Albrecht, Martin-Luther-Universität Halle-Wittenberg.

To maximize lateral resolution, stay close but not too close. PeakForce Tapping uniquely allows you to do this. See Physical Review B 56(7), 4159, 1992 LINK , and Chemical Review 88, 927 (1988) LINK for the detailed modeling of the tip-sample interaction.





Pinpoint force to any atom on your sample.






Jumpstart your perovskite, graphene, and 2D material research.



PeakForce QNM® modulus images of graphene on hexagonal boron nitride, revealing a transition to a commensurate lattice upon alignment with highly localized strain relief. See also Nature Physics 10, 451–456 (2014). LINK


Multimode 8-HR AFM

Unleash Bandwidth to Go Fast and Explore Real-Time Changes

Use bandwidth to go fast, enhance resolution, or anywhere in between.

High-speed imaging capturing the emergence of anisotropy in the phase transition of mesomorphic polydiethylsiloxane.







Record high-speed nanoscale dynamics.







Measure challenging topography.



Migration of c2c12 stem cell, capturing contributions of both, membrane flow and the underlying cytoskeleton to movement of the cell.

Amorphous drug formulations study, capturing 60 sites in 60 minutes. Samples courtesy M. E. Lauer, O. Grassmann, F. Hoffmann-LaRoche, Basel, Switzerland.








Combine speed and stability.






The fastest AFM speeds — completely independent of sample size.

Angstrom-level roughness measurements across an entire wafer. 96 measurements within 2 hours.


Dimension FastScan AFM

Unlimited Potential—Fully Flexible and Open Architecture





Complete environmental solutions for battery, organic solar, and beyond.





Be first with the widest range of unique modes; when it does not exist, invent it.


Directly access our software and electronics in the way that is easiest for you, including COM, breakout box, nanoman/litho, and force scripting.

Left: Instrument integration example using COM access to NanoScope. Right: NanoScript programming in C++ environment.

Left: AFM-Raman correlation while in glove box. Right: Photoconductive AFM accessory.




Modify our open platform to correlate any additional technique.

Get the code and learn.


Capture the Most Complete Quantitative Nanoscale Data

Recalibrate your expectations.

Syndiotactic polypropylene domains (violet) surrounded by a PMMA (teal) matrix. Topographic data painted with modulus to allow easy identification of components, revealing lamellae formed by syndiotactic polypropylene that propagate through the PMMA matrix. Image size 8 µm.






Routine quantifiable mechanical data.






Electrical investigation on previously impossible samples.



Current imaging on vertically standing carbon nanotubes. Only possible with PeakForce TUNA®.

Left: Atomic-scale force cube with PeakForce Capture™ showing the positions of individual atoms in a vertical (XZ) cut. Right: Averaged PeakForce Capture data showing evidence of solvent structure.






Capture the entire force cube to fully characterize contact mechanics.

Real-time investigation of the chemical information of atoms.

PeakForce Tapping height images (left) and force curves (right) showing the difference in surface atom arrangement and atomic scale tip-sample interaction between calcite and mica.


Surprisingly Simple

Focus on your research.

Completely unattended, automated, fully self-optimizing imaging of six different samples within ten images, yielding publication-quality results in each case.






Hardware, software, and control algorithms that make you an immediate expert.







NanoScope® is the most adopted, and most cited AFM product in the world.

Meet our team of experts.

We're always with you.