Hysitron TriboScope | Bruker

Hysitron TriboScope

Enhance the Characterization Capabilities of Your AFM

Bruker’s Hysitron TriboScope® delivers quantitative, rigid-probe nanoindentation and nanotribological characterization capabilities to the world of atomic force microscopy. The Hysitron TriboScope interfaces with Bruker’s Dimension Icon®, Dimension Edge™, and MultiMode® 8 AFMs to expand the characterization capabilities of these microscopes. By utilizing a rigid test probe, the TriboScope removes the intrinsic limitations, variability, and complexity associated with cantilever-based measurements to deliver quantitative and repeatable mechanical and tribological characterization over nanometer-to-micrometer length scales.

Contact Us Download Brochure

Hysitron TriboScope | Bruker
surface analysis

Quantitative, Reliable, and Repeatable

Expanding the Capabilities of our Industry-Leading AFMs

The TriboScope quickly interfaces to Bruker’s Dimension Icon, Dimension Edge, and MultiMode 8 systems.

On Off
Hysitron TriboScope | Bruker

The TriboScope Advances Your Research with Innovative Testing Modes

Quasi-Static Nanoindentation

Perform quantitative measurement of elastic modulus, hardness, creep, stress relaxation, and fracture toughness of localized microstructures, interfaces, small surface features, and thin films.

In-Situ SPM Imaging

Utilize the same test probe for testing and topographic imaging for nanometer precision test placement

accuracy and the ability to characterize post-test material deformation behavior.

ScanningWear

Raster scan the test probe over the sample surface at a user-definable force setpoint for quantitative

wear resistance characterization at the nanoscale.

NanoScratch

Perform quantitative scratch/mar resistance, friction coefficient, and thin film adhesion measurements

with Bruker’s exclusive 2D lateral force transducer technology.

nanoDMA III - Dynamic Nanoindentation

Continuously measure elastic-plastic and viscoelastic properties as a function of indentation depth,

frequency, and time with Bruker’s nanoDMA® III option.


The Rigid-Probe Advantage

Most AFMs utilize a compliant cantilever to conduct mechanical or tribological testing, posing significant challenges in separating a cantilever’s flexural and rotational stiffness from the material’s response to applied stress. The TriboScope utilizes a rigid test probe assembly, allowing direct control and measurement of applied force and displacement during the test.

TriboScope - Rigid-Probe Nanoindenter | Bruker
TriboScope Transducer | Bruker

Electrostatic Actuation

The TriboScope utilizes proprietary electrostatic force actuation and capacitive displacement sensing transducer technology to deliver industry-leading noise floors and low thermal drift for characterizing properties to the bottom of the nanoscale.


Force and Displacement Feedback Control

The TriboScope operates under closed-loop force control or displacement control. Utilizing a 78 kHz feedback loop rate, the TriboScope can respond to fast material deformation transient events and faithfully reproduce the test function defined by the operator.

TriboScope - Force and Displacement Feedback Control | Bruker