Triboscope Banner

Hysitron TriboScope

Enhance the Characterization Capabilities of Your AFM

Bruker’s Hysitron TriboScope® delivers quantitative, rigid-probe nanoindentation and nanotribological characterization capabilities to the world of atomic force microscopy. The Hysitron TriboScope interfaces with Bruker’s Dimension Icon®, Dimension Edge™, and MultiMode® 8 AFMs to expand the characterization capabilities of these microscopes. By utilizing a rigid test probe, the TriboScope removes the intrinsic limitations, variability, and complexity associated with cantilever-based measurements to deliver quantitative and repeatable mechanical and tribological characterization over nanometer-to-micrometer length scales.

Contact Us Download Brochure

TriboScope tool image
surface analysis

Quantitative, Reliable, and Repeatable

Expanding the Capabilities of our Industry-Leading AFMs

The TriboScope quickly interfaces to Bruker’s Dimension Icon, Dimension Edge, and MultiMode 8 systems.

On Off
Triboscope 4 images

The TriboScope Advances Your Research with Innovative Testing Modes

Quasi-Static Nanoindentation

Perform quantitative measurement of elastic modulus, hardness, creep, stress relaxation, and fracture toughness of localized microstructures, interfaces, small surface features, and thin films.

In-Situ SPM Imaging

Utilize the same test probe for testing and topographic imaging for nanometer precision test placement

accuracy and the ability to characterize post-test material deformation behavior.


Raster scan the test probe over the sample surface at a user-definable force setpoint for quantitative

wear resistance characterization at the nanoscale.


Perform quantitative scratch/mar resistance, friction coefficient, and thin film adhesion measurements

with Bruker’s exclusive 2D lateral force transducer technology.

nanoDMA III - Dynamic Nanoindentation

Continuously measure elastic-plastic and viscoelastic properties as a function of indentation depth,

frequency, and time with Bruker’s nanoDMA® III option.

The Rigid-Probe Advantage

Most AFMs utilize a compliant cantilever to conduct mechanical or tribological testing, posing significant challenges in separating a cantilever’s flexural and rotational stiffness from the material’s response to applied stress. The TriboScope utilizes a rigid test probe assembly, allowing direct control and measurement of applied force and displacement during the test.

Triboscope Cantilever Image
Triboscope Displacement Image v2

Electrostatic Actuation

The TriboScope utilizes proprietary electrostatic force actuation and capacitive displacement sensing transducer technology to deliver industry-leading noise floors and low thermal drift for characterizing properties to the bottom of the nanoscale.

Force and Displacement Feedback Control

The TriboScope operates under closed-loop force control or displacement control. Utilizing a 78 kHz feedback loop rate, the TriboScope can respond to fast material deformation transient events and faithfully reproduce the test function defined by the operator.

Triboscope Graph Image