Bruker at M&M 2025
Visit us at Booth 1424
July 28 - 31 | Salt Palace Convention Center | Salt Lake City, Utah
Discover Bruker’s powerful portfolio of microscopy and spectroscopy solutions and connect with our experts to learn how our technologies are advancing research in materials science, semiconductors, polymers, and life sciences.
- Learn how the new Dimension Nexus benchtop AFM integrates milestone Bruker innovations into a cost-effective system to deliver wider access to top AFM performance.
- Explore the power of nanoIR spectroscopy, including the new REFV AFM-IR mode for extended sample compatibility and measurement capabilities.
- See how our Electron Microscopes and Electron Microscope Analyzers are enabling breakthroughs in high-resolution imaging and analysis. Explore the eWARP - the fastest EBSD detector ever.
- Experience the advanced capabilities of our PicoIndenters for in-situ nanomechanical testing and precise, high-throughput materials characterization.
- Discover our portfolio of 3D X-Ray Microscopy (XRM) solutions based on micro-CT technology, featuring the new X4 POSEIDON benchtop.
Click below to find out more about this event and the featured products and technology:
Join Us for In-Booth Presentations
Lunch & Learns at M&M 2025
We’re hosting Lunch & Learns right in our booth, where Bruker scientists will present key applications and technologies. Space is limited. Reserve your seat to guarantee a boxed lunch.
Monday, July 28 | 12:30PM | Booth 1424
EBSD 4.0 is Here and is Based on Pixelated Sensors, i.e., Direct Electron Detection!
Since the 1990s, EBSD acquisition speed has made massive progress, but signal efficiency has plateaued due to limitations of the indirect detection method. This lunch & learn presentation will introduce our novel direct electron detection approach utilizing a pixelated sensor technology, specifically designed for EBSD applications. The advantages and performance of this custom pixelated sensor technology will be demonstrated through relevant application examples.
Tuesday, July 29 | 12:30PM | Booth 1424
Correlation of Mechanical Properties, Microstructure, and Analytical Mapping of Materials using PI 89 Auto SEM PicoIndenter
The Hysitron PI 89 Auto SEM PicoIndenter offers advanced capabilities for in-situ nanomechanical testing, combining full automation with seamless integration into correlative microscopy workflows. It enables co-localized acquisition of quantitative mechanical data at user-defined regions of interest, guided by high-resolution imaging and analytical mapping. Automation provides a 10–30 times increase in throughput compared to manual testing—without compromising precision—allowing efficient characterization across multiple sample locations. Enhanced by TriboScan Auto software, the system features a unified interface for EBSD, EDS, imaging, and indentation, leveraging encoded linear motion and a patented dual-configuration rotation and tilt (R/T) stage. This demonstration showcases the use of the PI 89 Auto for advanced micro- and nano-mechanical characterization.
Thursday, July 31 | 12:30PM | Booth 1424
Revolutionizing Benchtop 3D X-ray Microscopy: The Bruker X4 POSEIDON
The Bruker X4 POSEIDON is a significant advancement in benchtop 3D X-ray microscopy (micro-CT), offering the performance of larger systems in a compact, modular design. This Lunch 'n Learn talk will cover the X4 POSEIDON's architecture, including its innovative Multi-Vision configuration with dual detectors for analytical flexibility, and its high-resolution imaging capabilities down to 2 µm. The system is powered by Bruker's 3DxSUITE software, which provides automated workflows, intuitive user interfaces, and robust data management. A live demonstration will showcase the system's performance and user-friendly interface in real time.
Vendor Tutorials
We’ll also be offering Vendor Tutorials after hours in the booth—no RSVP required. Just stop by, grab a seat, and enjoy the insights.
Monday July 28 | 5:45PM – 6:45PM | Booth 1424
Nanoscale Chemical Identification and Mapping with AFM-IR
SEM/EDX is an industry standard technique for surface characterization using x-rays generated in-situ within an electron microscope and provides elemental information on the nanoscale. While powerful, EDX has key limitations discriminating lighter elements as well as carbon deposition induced by the electron beam. AFM-IR (Atomic Force Microscopy-Infrared) is a complementary technique which can provide non-destructive <10 nm lateral resolution chemical identification in ambient conditions. AFM-IR correlates strongly with traditional FTIR spectroscopy which allows FTIR chemical libraries to be used to identify compounds measured with AFM-IR. This presentation introduces AFM-IR, discusses the benefits of the technique and its core strengths in identification of lighter elements, especially carbon containing species and highlights core applications of this novel technique.
Tuesday July 29 | 5:45PM – 6:45PM | Booth 1424
Benchtop XRM for Materials Science: Accessible, Modular, and Non-Destructive 3D Imaging Solutions
Benchtop X-ray Microscopy (XRM) is redefining analysis in materials science by delivering high-resolution, non-destructive 3D imaging in a compact, modular format. This talk features Bruker’s X4 POSEIDON system, which enables detailed internal visualization and quantification of metals, polymers, composites, and more — ideal for applications like additive manufacturing, failure analysis, and porosity characterization. With flexible configurations and intuitive workflows, Bruker’s benchtop XRM solutions empower researchers to perform advanced microstructural analysis without the need for large-scale infrastructure. Discover how XRM can provide a more complete and insightful understanding of your samples.
Wednesday, July 30 | 5:45PM – 6:45PM | Booth 1424
Latest Developments with Nion Microscopes
The Nion Microscope series by Bruker has demonstrated 2.6 meV energy resolution, atomic-resolution secondary electron imaging in a clean UHV environment, and now atomic-resolution STEM and spectroscopy with the sample at 9 Kelvin. This tutorial will describe these developments and show recent applications including a live demonstration of the instrument.
In-Booth Demos with Nion!
Join us at 4:00pm on Tuesday and Wednesday in booth 1424 for live demonstrations of Bruker Nion microscopes. No registration required, all guests are welcome!
Tuesday, July 29 at 4:00pm
Atomic resolution imaging below 10 Kelvin
The liquid helium cryo-stage is available for the Bruker Nion series of aberration-corrected STEM instruments. Our new cryo-stage allows for STEM-EELS and 4D-STEM with atomic resolution, all at sample temperatures below 10 Kelvin with continuous operation times of up to 20 hours. The sample temperature can be set up to 80 Kelvin with exceptional temperature and mechanical stability. The latest capabilities of the cryo-stage will be demonstrated.
Wednesday, July 30 at 4:00pm
Atomic resolution secondary electron imaging
Bruker's Nion Scanning Transmission Electron Microscopes now feature secondary electron detectors on both the top and bottom sides of the sample. Combined with its aberration corrector, a near UHV (1e-10 torr) pressure in the sample stage, and an in-situ laser based surface cleaning capability, the microscope readily achieves atomic resolution secondary electron imaging, simultaneous with the existing imaging channels. In this live demonstration, we will showcase these capabilities by imaging the surfaces of various materials at atomic resolution.
Poster Presentation
Facilitating Nanomechanical Evaluation of Heterogeneous Microstructures
Understanding the property distributions at the microstructural level is valuable for evaluating material problems, especially those in which spatial variation is expected. Not only can heterogenous microstructures be characterized, but those crossing regions of interest, like processing induced heat affected zones can also be evaluated. Combining nanoindentation for mapping of the localized elastic and plastic properties [1] with other correlated techniques for visualization, chemical or structural analysis [1,2] enables deeper understanding of the structure-processing-properties relationship that is crucial towards developing new materials and better processing conditions, particularly when combined with automated analysis [3].
Two forms of progress are presented which help facilitate gathering this type of microstructure-scale correlated nanoindentation data. One is easy co-location of the nanoindentation data with chemical information from energy-dispersive spectroscopy (EDS) and structural data from electron backscatter diffraction (EBSD) using the Bruker Hysitron PI 89 Auto SEM PicoIndenter. This instrument is an in-situ SEM nanoindenter that utilizes a rotation and tilt stage to orient the sample towards the indenter for mechanical testing, towards the electron column for top-down imaging and EDS, and at an angled position to enable EBSD. The same sample locations can be seamlessly moved between all three orientations such that features identified in one can be easily targeted in the other two. An example data set measuring hardness across a heat-affected zone in a 410 stainless steel laser cladding onto a 4140 steel substrate is shown in Figure 1. The elevated hardness in the heat affected zone can clearly be identified, and the 410 laser cladding shows a bimodal distribution which is confirmed by the correlated EBSD to result from a dual-phase microstructure of ferrite and tempered martensite.
The second advancement is displacement-controlled nanoindentation mapping with surface detection triggers. The spacing between indents without influencing the nearest neighbors is controlled by the indentation depth, so when mapping properties of samples with high hardness variability this allows for the best mapping resolution. This mode is enabled by control enhancements on the Bruker Hysitron TI 990 TriboIndenter, which allow for force or displacement triggers to be set for segment switching. This enables high-throughput detection of the surface and can be employed on rough samples or with surface tilt. An example showing tight spacing of 200nm on a cast iron sample can be seen in Figure 2, where the hardness difference between the ferrite and the graphite phases is ~10x.
Authors:
- Eric D. Hintsala1 (Eric.Hintsala@Bruker.com)
- Kevin M. Schmalbach1
- Douglas D. Stauffer1
- Sanjit Bhowmick1
1 Bruker, Eden Prairie, MN, USA
References:
[1] E.D. Hintsala, U. Hangen, D.D. Stauffer, High-Throughput Nanoindentation for Statistical and Spatial Property Determination, JOM. 70 (2018) 494–503.
[2] Y. Chen, E.D. Hintsala, N. Li, B.R. Becker, J.Y. Cheng, B. Nowakowski, J. Weaver, D.D. Stauffer, N.A. Mara, High-throughput nanomechanical screening of phase-specific and temperature-dependent hardness in AlxFeCrNiMn high-entropy alloys, JOM, 71 (2019), 3368-3377.
[3] B.R. Becker, E.D. Hintsala, B. Stadnick, U.D. Hangen, D.D. Stauffer, Automated analysis method for high throughput nanoindentation data with quantitative uncertainty, Journal of Applied Physics, 132 (2022), 185101.
Session: A07.P2 - Advances in SEM Instrumentation, Application and Techniques
Date: Thursday July 31, 2025 | 3:00 PM - 5:00 PM
Presentation Title: 2064147 | Facilitating Nanomechanical Evaluation of Heterogeneous Microstructures
Discover Smarter Support with Bruker LabScape and Enhanced Remote Tools
Our Service team will be showcasing how Bruker is redefining service support. Stop by the booth to experience our Enhanced Remote Tools in action. These remote tools allow our experts to be virtually present in your lab, helping to diagnose issues quickly and efficiently. We’ll demonstrate how easy it is to connect with us and we’ll show how support can be even more immersive with your smartphone or an optional AR headset. Come learn how Bruker is making service smarter, faster and more accessible.
Featured Products & Technologies
New Dimension Nexus
Dimension Nexus™ delivers an ideal combination of data quality, experiment flexibility, and ease of use in a small-footprint system. It incorporates the milestone innovations of Bruker's NanoScope® 6 controller, PeakForce Tapping® technology, and ScanAsyst® Plus self-optimizing imaging software to deliver more functionality than competing systems in its class. Suitable for both routine and custom experiments and easily upgradable in the field, Dimension Nexus is both an excellent starter system and a perfect addition to any thriving AFM lab.
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