Cryogenic Wafer Cleaning

WC-2200

Non-Aqueos CO₂ Cryogenic Dry Cleaning

Full-Wafer Processing

up to 200 mm

Cryogenic Dry CO­­₂ Wafer Cleaning System

The Bruker Wafer Clean 2200 System removes particulate contamination and thin film organic residues from silicon, compound semiconductor, MEMS and thin film head substrates using a unique carbon dioxide (CO2) snow cleaning process. CO2 snow cleaning is fast, dry, chemical-free and non-damaging. The all-dry process offers numerous advantages over conventional wet and plasma cleaning techniques. This fully automated, high volume production system is field proven with over 100 systems running 24/7 in high volume production applications around the globe.

25 WPH
Raster Scan movement
Global and local cleaning
Yield Improvement
Cleaning Efficiency down to 120nm
IBE Veil and Fence removal
Solvent Free
No wet chemistry
ZERO Hazardous Waste
Support

How Can We Help?

Service and Application Support to Optimize Tool Utilization

The decision to invest in high-performance metrology is based on more than instrument performance and price. Bruker is committed to keeping your tool running at the peak of up-time and productivity. We have a highly educated worldwide team of service and support personnel that takes great pride in first-time solution of issues. Our variety of service coverage programs can be customized to match your specific requirements, including optimization of tool performance, recipe writing, and in-person technical support visits.

Bruker tailors services to your needs:

  • Priority technical support
  • Advance replacement parts and assemblies stored in regional warehouses for rapid response times
  • Application and training services

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