X-Ray Metrology For Silicon Semiconductors

SIRIUS-RF

Fourth generation system to provide industry standard reliability

SEMI standard compliance

Sirius-RF

The Sirius-RF is the fourth generation system in a mature platform to provide industry standard reliability, ease-of-use, fab automation, and SEMI standard compliance.

Convergent Beam
XRR
Offers fast, first-principle thickness and density measurements on scribe-lines
Dual Source
µXRF configuration
Delivers flexibility and best performance for a variety of layers per device
Multi-Stack
measurement capability
Composition and thickness measurements on metrology pads or directly on-device in a non-destructive manner
Features

Sirius-RF Features

  • Convergent beam XRR for fast, first-principle thickness and density measurements on scribe-lines
  • Dual source µXRF configuration for flexibility and best performance for variety of layers per device
  • For advanced memory (DRAM, PCRAM, 3D-NAND, MRAM), Logic, power devices and packaging
  • Composition and thickness measurement
  • On metrology pads or directly on-device (non-destructive manner)
  • Multi-stack measurement capability
Applications

Application Example: PCRAM

  • Composition and thickness of the memory element (GeSbTe - GST) and Ovonic Threshold Switch (OTS, GeAsSe) are critical parameters
  • Sirius-RF µXRF allows in-line composition monitoring on metrology pads or device areas
  • Fast convergent beam XRR allows thickness measurement at 1-2 seconds per point.

Support

How Can We Help?

Bruker partners with our customers to solve real-world application issues. We develop next-generation technologies and help customers select the right system and accessories. This partnership continues through training and extended service, long after the tools are sold.

Our highly trained team of support engineers, application scientists and subject-matter experts are wholly dedicated to maximizing your productivity with system service and upgrades, as well as application support and training.

Contact Us

Input value is invalid.

* Please fill out the mandatory fields.

Please enter your first name
Please enter your last name
Please enter your e-mail address
Please enter your Company/Institution

     

Please enter a valid phone number

ⓘ Used to provide a faster response to your request/question.

Please enter a valid phone number

ⓘ Used to provide a faster response to your request/question.

Please enter a valid phone number

ⓘ Used to provide a faster response to your request/question.

Please enter a valid phone number

ⓘ Used to provide a faster response to your request/question.

Please add me to your email subscription list so I can receive webinar invitations, product announcements and events near me.
Please accept the Terms and Conditions

             Privacy Notice   Terms of Use