硅基半导体的X射线量测方案

SIRIUS-RF

第四代X射线量测系统,引领行业可靠性标准

Sirius-RF

Sirius-RF 是基于成熟平台开发的第四代X射线量测系统,以其卓越的可靠性和易用性,为行业树立了新的标杆,配置支持晶圆厂全自动化产线,且完全符合 SEMI 标准规范。

会聚束型X射线反射
XRR
可在无图形片、或图形片中的划片线上实现快速、准确、基于第一性原理的厚度与密度测量
双光源
微焦斑型X 射线荧光 (µXRF)
可灵活适配不同器件产品的晶圆上的多层结构,性能表现优异
面向多层堆叠结构
强大测量能力
可在量测用图形上或直接在器件区域,以无损方式完成组分与厚度测量
Features

Sirius-RF Features

  • 会聚束 X 射线反射(XRR)技术,可在无图形片、或图形片中的划片线上实现快速、准确、基于第一性原理的厚度与密度测量
  • 双光源、微焦斑型X 射线荧光(µXRF)配置,灵活适配不同器件晶圆上的多层结构,性能表现优异
  • 适用于先进存储(DRAM、PCRAM、3D-NAND、MRAM)、逻辑芯片、功率器件以及封装领域
  • 精准的组分和厚度测量
  • 可在量测用图形上、或直接在器件区域进行无损检测
  • 具备多层堆叠结构的测量能力
应用实例

相变存储器(PCRAM) 

  • 可对存储单元(GeSbTe - GST)和Ovonic阈值开关(OTS,GeAsSe)的组分和厚度等关键参数进行精准表征
  • Sirius – RF的微焦斑型X 射线荧光(µXRF)技术可在量测用图形上、或直接在器件区域进行在线组分监测
  • 高速会聚束X 射线反射(XRR)技术支持厚度测量,单点耗时仅 1-2 秒 

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Our highly trained team of support engineers, application scientists and subject-matter experts are wholly dedicated to maximizing your productivity with system service and upgrades, as well as application support and training.

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