Beyond the Surface: A Nanoscale Characterization and Metrology Workshop
August 26-27, 2026
Explore New Advances and Research Trends
Bruker, in collaboration with The Pennsylvania State University, is pleased to invite you to a free two-day workshop on Nanoscale Surface Characterization and Metrology, taking place on August 26–27, 2026, at Penn State University.
This workshop will explore the latest advances in nanoscale characterization techniques, including AFM, AFM-IR, Optical Profilometry, Ellipsometry, and Nanoindentation. Through expert presentations and live demonstrations, you will gain practical insights into nanoscale property analysis, high-speed and high-throughput measurements, and automated workflows.
You will also have the opportunity to interact directly with Bruker specialists and discuss your own measurement challenges.
Attendance is free of charge, but spaces are limited.
Please register early to secure your spot.
We look forward to welcoming you to Penn State!
Location:
The Pennsylvania State University
Millennium Science Complex
Room N310
491 Pollock Road
University Park, PA 16802
Agenda — Wednesday, August 26
| Time | Topic | Presenter (Bruker) |
| 09:00 AM | Registration | |
| 09:20 AM | Introduction | |
| 09:30 AM | Nanoscale electrical/magnetic/mechanical/chemical characterization with AFM/AFM-IR | John Thornton, Senior Applications Scientist |
| 10:30 AM | Optimize your Josephson junctions with magnetic field – the quick way (virtual presentation) | Roeland Huijink, Senior System Engineer |
| 11:10 AM | Recent progress on high-speed AFM and high-throughput mechanical property measurement | Jianjun Yao, Sales Account Manager of Mid Atlantic |
| 12:00 PM | Lunch (provided by Bruker) | |
| 01:00 PM | Automated multi-angle reflectometry and ellipsometry with the FilmTek 2000 PAR-SE | Lawrence Rooney, Senior Applications Scientist |
| 02:00 PM | Automated non-contact 3D optical profilometry for nanofabrication Process Control | Nishant Kodan, Technical Account Manager |
| 03:00 PM | Bridging process steps in nanofabrication: The role of Bruker TriboLab CMP | Dr. Sai Krishna Kancharla, Tribology Applications Scientist |
| 03:30 PM | Live demo on optical profilometer | |
| 04:00 PM | End of Day 1 |
Agenda — Thursday, August 27
| 09:00 AM | Hands-on sessions with AFM and optical profilometer | |
| 04:00 PM | End of Event |
Workshop Organizers
David Louis Fecko
Director of MRI Industry Collaborations
Penn State Materials Research Institute
dlf5023@psu.edu
Timothy Tighe, Ph.D.
Metrology Lab Manager
Materials Characterization Lab
tbt1@psu.edu
Nishant Kodan
Applications Scientist, Bruker
Nishant.Kodan@bruker.com
Jianjun Yao
Sales Account Manager for Mid Atlantic, Bruker
Jianjun.Yao@bruker.com
