S4 T-STAR

S4 T-STAR^® 是一种多功能工具，用于分析各种样品类型，包括悬浮液、粉末、纳米颗粒或薄膜，制样简单，无需消解，而ICP则需要完全溶解的液体样品。

• TXRF 光谱仪 S4 T-STAR^® 提供<ppb 范围内的最低检测限值。
  
• TXRF 运营成本极低，无需气体、冷却介质或复杂的实验室基础设施。
• 自动校准功能，基本无需后期维护
• 优化后的测试系统支持工业级24h不间断测试。
• Bruker多样化的样品托盘和工具为用户提供了更多选择，可加快样品制备速度，降低样品污染风险。

The GIXRF Option for the S4 T-STAR allows users to undertake advanced materials characterization via GIXRF (Grazing Incidence X-Ray Fluoresence). GIXRF is particulary suited for the analysis of nanoparticles, monolayers and systems with stratified layers. Find out more by downloading the flyer. 

When detecting samples at ultra-low ppb limits contamination avoidance is of the highest priority – when working with a pure sample the key to this is excellent sample preparation.

Bruker provides a range of accessories alongside their S4 T-STAR and S2 PICOFOX systems.

These include a T-BOX to help achieve contamination-free and accurate sample pipetting and the T-DRY for the vacuum desiccation of samples; with both being designed to help users avoid making any contact with the sample carrier.

Following the collection of measurements, the sample disks can be efficiently and effectively cleaned for later use using Bruker’s chemically resistant washing cassette before clean storage in the T-BOX.

Find out more by dowloading our TXRF Accessories Brochure and watching our video on sample preparation during TXRF.