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S4 T-STAR - GIXRF Option - Flyer

Learn more about the GIXRF Option for the S4 T-STAR and how it can be used for advanced materials characterization, including nanoparticle, monolayer and stratified layer analysis.

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S4 T-STAR

High-volume TXRF spectrometer for ultra-trace (sub-ppb) elemental analysis of very small sample amounts in the pg, ng or µg range: low operating cost, “green” technology

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