Latest Advancements in Nanoscale IR Spectroscopy: Resolution, Performance and Speed
The new Resonance Enhanced AFM-IR (REINS) mode measures thin samples' sizes down to single monolayers at high spatial resolution.
"FASTspectra™ provides High-speed Spectroscopy and Extends the Spectroscopic Range of Resonance Enhanced AFM-IR"
The new Resonance Enhanced AFM-IR (REINS) mode measures thin samples sizes down to single monolayers at high spatial resolution. It delivers spectra data in seconds.
Webinar Topics
FASTspectra™ technology
Extended range resonance enhanced source
Quantitative AFM-IR
Life science applications
Material sciences applications
Speaker
Kevin Kjoller
VP of Product Development, Bruker Anasys Instruments