3D-EBSD/EDS is a destructive tomographic method consisting of repeated sectioning and subsequent crystallographic surface characterization by Electron Backscatter Diffraction (EBSD) and simultaneous elemental analysis by Energy-Dispersive Spectrometry (EDS). Typically, an integrated in-situ sectioning technique is applied, such as an SEM-based focused ion beam (FIB), to generate accurately spaced serial sections. The measured data set is later reconstructed, visualized and analyzed with dedicated software.
The current webinar will review our latest developments in 3D EBSD processing by Peter Konijnenberg from Bruker and MPIE in Düsseldorf. We will first review the unique capabilities of our ESPRIT QUBE software for 3D EBSD and EDS datasets including slice registration (realignment), data filtering, grain reconstruction, subsetting and more advanced data analyses. Then, we will present our latest developments on the crystallographic characterization of the grain boundary planes by a triangular surface meshing method.
This 45 min webinar will be round off by a 15-minute live Q&A session where our experts will answer your questions.
Dr. Laurie Palasse
Global Application Manager, Bruker Nano Analytics
Senior Data Scientist, Bruker Nano Analytics, MPIE Max-Planck-Institut für Eisenforschung, Düsseldorf
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