▶ WATCH ON-DEMAND | 2 Hrs 55 MINUTES

Surface Characterization of Semiconductor Materials and Devices

Explore the nanoscale properties of semiconductor materials

Watch Individual Sessions:

Watch Full Workshop:

Watch Now | 26 Minutes

AFM Applications for Semiconductors: Automation, Metrology, and Advanced Techniques

Presented by John Thornton, Sr. Applications Engineer, Bruker (July 7, 2021)

Learn More: AFMs for Materials

Watch Now | 23 Minutes

Nanoscale Chemical Analysis of Contaminants Using Photothermal AFM-IR

Presented by Cassandra Phillips, Ph.D., Applications Scientist, Bruker (July 7, 2021)

Learn More: NanoIR Spectrometers

Watch Now | 25 Minutes

Mechanical Characterization of Semiconductor Samples and Devices

Presented by Douglas Stauffer, Ph.D., Senior Manager of NI Applications Development, Bruker (July 7, 2021)

More: Nanomechanical Testers

Watch Now | 29 Minutes

Semiconductor 3D Metrology Using Optical & Stylus Profilers

Presented by Sandip Basu, Ph.D., Application Scientist, Bruker (July 7, 2021)

Learn More: 3D Optical Profilers Learn More: Stylus Profilometers

Watch Now | 36 Minutes

Bridging the Gap Between Bench-Scale Research and Commercial Manufacturing

Presented by Kora Farokhzadeh, Ph.D., Application Scientist, Bruker (July 7, 2021)

Learn More: Mechanical Testers

Watch Now | 32 Minutes

Automated AFM Metrology of Semiconductor Wafers for Yield Management

Presented by Ingo Schmitz, Ph.D., Technical Marketing Engineer, Bruker (July 7, 2021)

Learn More: Automated AFMs

Featured Products

nanoIR3 - Nanoscale Infrared Spectrometer

Anasys nanoIR3

Streamlined solution for routine photothermal AFM-IR on small samples, providing easy-to-use functionality and direct, interpretable chemical identification on organic and inorganic materials

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ContourGT-X 3D Optical Profilometer

ContourGT-X

State-of-the-art gage-capable automation for 3D surface metrology in R&D and Production

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DektakXT Stylus Profilometer

DektakXT

The gold standard in stylus profiling

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Dimension HPI AFM

Dimension HPI

Most productive industrial R&D AFM

DOWNLOAD BROCHURE

Hysitron TI 980 TriboIndenter

Hysitron TI 980 TriboIndenter

Versatile nanomechanical and nanotribological test system for advanced material characterization

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InSight CAP HP

InSight CAP HP

InSight CAP HP is the world's most intuitive, easiest-to-use, cost-effective AFP providing the highest value, performance, and lowest cost-of-ownership

TriboLab CMP Tribometer and Mechanical Tester

TriboLab CMP

R&D-scale process and material characterization system for wafer polishing processes

DOWNLOAD BROCHURE

Featured Technology

3D Optical Profilers

3D Optical Profilers

Non-contact 3D surface measurement, inspection, and analysis

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Automated-AFM

Automated AFM Metrology

Automated AFM metrology solutions reliably measure surface roughness, chemical mechanical planarization (CMP), and etch-depth features

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AFM-Materials-BRUKER

AFM for Materials

Bruker's materials research atomic force microscopes, powered exclusively by PeakForce Tapping® technology, are helping researchers advance new nanomechanical, nanoelectrical, and nanoelectrochemical research, on the order of three peer-reviewed published articles per day.

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Nanomechanical Test Systems

Nanomechanical Test Systems

Stand-alone solutions for highly accurate and reliable quantitative mechanical and tribological characterization at the nano- and microscales

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Nanoscale Infrared Spectrometers

Nanoscale Infrared Spectrometers

Bruker's nanoIR spectrometers are the world leader in photothermal IR spectroscopy from the nanoscale to the sub-micron and macro scales.

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Dektak Stylus Profilometers

Stylus Profilometers

Surface roughness characterization, step height measurements, and film stress analyses

REQUEST MORE INFORMATION

Tribometers and Mechanical Testers

Tribometers and Mechanical Testers

Testing and measurement of friction, wear, and material mechanical properties

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