Research FT-IR Microscope


The HYPERION is our research platform for infrared microscopy. The instrument is customizable and offers a wide range of specialized accessories for dedicated research applications.
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From Microscopy to Imaging


The HYPERION is the culmination of more than 30 years of experience in FT-IR microscopy. Its high-quality design, including all optical, mechanical, and electronic components, provides high stability and reliability. Featuring many contrast enhancement tools, a wide variety of dedicated objectives, and chemical imaging, the HYPERION enables you to conduct the most sensitive microanalysis easily and efficiently. With its modular design, the HYPERION can be customized to the specific requirements of each application. Its field of use is extremely broad and includes materials research, polymers, chemicals, forensics, art conservation, and life sciences.

Sensitivity, Lateral resolution

The lateral resolution power of the HYPERION is only limited by diffraction of the incident light. Due to the high light-throughput a very high sensitivity is reached even at the highest lateral resolution.

The infrared beam path in the HYPERION is confocal. Apertures can be placed in conjugate image planes individually before and after the sample in transmission as well as in reflection. In the standard configuration, the HYPERION is equipped with a single transparent knife-edge aperture. Metal knife-edge apertures, iris apertures and aperture wheels are available as well as automatic, software-controlled knife-edge apertures.


Sampling flexibility

For FT-IR microscopic analysis in transmission, most samples must be optically thin and are typically cut in sections about 5–15 μm thick. If samples are deposited on reflective substrates, they are measured in reflection. As standard a 15x objective is used or as alternative for smaller samples more focussing objectives (20x, 36x) can be employed. However, because many samples are not transparent or reflective, they can be readily analyzed utilizing the attenuated total reflection (ATR) mode.

The dedicated ATR objective (20x) for the HYPERION combines a visual sample inspection without restrictions with highest sensitivity of the IR measurement. To be useful for samples ranging from soft to very hard, different pressures can be selected at the ATR objective. The internal pressure sensor reproducibly ensures optimal contact between the sample and the crystal even during automated ATR mapping measurements.

The measurement of very thin coatings on metallic surfaces often requires the grazing angle incidence reflection technique that enhances the interaction of the infrared light with the sample. Due to its patented design Bruker's grazing angle objective (GAO) achieves a very high sensitivity that even allows analyzing mono-molecular layer. Furthermore measurements with polarized light are possible.


Spectral Range

The spectral range of the HYPERION can be extended from the middle infrared to the near infared (NIR), even to the visible (VIS, up to 25,000 cm-1) and down to the far infrared (FIR, down to 80 cm-1). To cover this extremely broad spectral range, many different detectors are available and can easily be exchanged by the user. The HYPERION can be equipped with up to two detectors in parallel, where the switching between positions is controlled by the software.



The HYPERION is controlled by the OPUS software: an easy-to-use, powerful, all-in-one spectroscopy software. It includes the most comprehensive collection of data acquisition, processing, and evaluation functions. The software user interface can be customized for routine laboratory analysis as well as advanced R&D applications.

All resultant spectra, visual images, IR images, RGB and PCA plots, and annotations are stored within one file to ensure data integrity and make data manipulation straightforward.

Data acquisition using the HYPERION is very easy to accomplish, as it is guided by attractive wizards (OPUS 7.0). Many univariate and multivariate algorithms are implemented in OPUS to extract the relevant information out of the measured single or 3D data. Resulting IR images can be displayed in different 2D and 3D perspectives on top or beside the visible image.

INVENIO FT-IR Spectrometer with HYPERION 3000 FT-IR Microscope


Spectrometer Diagnostic

The HYPERION FT-IR microscope produces reliable data. The PerformanceGuard™ of the spectrometer includes permanent online diagnostics, realtime-display of the instrument status, and integrated automatic instrument tests (OQ, PQ). The OPUS software provides all options to perform the FT-IR analysis following the GMP and 21CFR-Part11 guidelines.


Flexible design

The HYPERION Series is a fully upgradeable microscope platform for conducting state-of-the-art optical and infrared analysis. The HYPERION 2000 includes all features found on the 1000 as does the 3000 with respect to the 2000.

  • HYPERION 1000: High performance infrared microscope with transmission and reflection capabilities, transparent knife-edge aperture and manual xy-stage. It is equipped with a nose piece with 15x cassegrain and 4x vis objective as well as binocular and video viewing.
  • HYPERION 2000: Fully automated microscope with motorized stage. All features of the HYPERION 1000 included.
  • HYPERION 3000: Fully automated FT-IR imaging microscope with modern focal plane array detector technology. The system includes also all features of the HYPERION 2000.



Visual Inspection

Before any sample can be analyzed by FT-IR microscopy, the region of interest has to be located on the sample. However, many microscopic samples do not exhibit much contrast in the visible image. The HYPERION provides many different techniques to enhance the contrast for the visible inspection of the sample in transmission and reflection.

  • Nose piece with a wide variety of objectives
  • Köhler apertures
  • Rotatable polarizers before and after the sample in transmission and reflection
  • Bright and dark field illumination
  • Fluorescence illumination

To view the visible image of the sample the HYPERION is equipped with a high quality CCD-camera. Additionally an eye-piece is always present allowing the observation of the sample with absolutely unaltered colors. A powerful autofocus is optionally available.

ATR Objective

Bruker’s dedicated ATR objective allows clear sample viewing without sacrificing infrared throughput. The internal pressure sensor reproducibly ensures optimal contact between the sample and the crystal during data acquisition.


Grazing Angle Objective

Bruker's patented Grazing Angle Objective is designed for the microanalysis of thin coatings on metallic substrates with extremely high sensitivity while retaining the polarization characteristics of the infrared beam.


IMAC Macro Imaging Chamber

The external sample chamber IMAC allows FT-IR imaging measurements on large samples. As in the HYPERION 3000 imaging microscope a state-of-the-art FPA detector is used in the IMAC.

Heatable Accessory Holder (A 599)

The heatable sample holder is used for the FT-IR and Raman spectroscopic microanalysis of various samples both in transmission and reflection mode. Software-controlled temperature ramp experiments are possible in the range from above ambient temperature to 180°C.


Heating and Cooling Stage (A 699)

This precision heating and cooling stage allows the FT-IR and Raman spectroscopic microanalysis of various samples in a temperature range from -196°C to 600°C

Chemical Imaging

High-resolution FT-IR Imaging

The HYPERION 3000 combines FT-IR imaging and single point spectroscopy in one microscope. Two separated optics inside the microscope guarantee a highly accurate, distortion-free image of the sample on the FPA (Focal Plane Array) detector when performing chemical imaging, whereas a maximum light throughput is achieved when the single element detector is used.

With the FPA detectors used in the HYPERION 3000 up to 16,384 spectra can be measured simultaneously covering sample areas of up to 340 x 340 µm with a pixel resolution of 2.7 µm. To analyze larger areas the measured IR images are assembled. Even higher lateral resolutions are achieved by objectives with higher numerical aperture (20x, 36x).

FT-IR imaging allows the spectroscopic examination of samples with a lateral resolution that is only limited by the wavelength dependent diffraction of light. Therefore, in mid-infrared a resolution of about 2.5 µm (at 4000 cm-1) is possible in the measurement modes transmission and reflectance. To achieve such a high lateral resolution a pixel resolution of 1.1 µm is realized in the HYPERION 3000 equipped with 36x objective.


The collection of the visual overview image of the sample, the selection of the interesting measurement area and the subsequent, automatic measurement are performed using the OPUS/Video software module. As result of the measurements the FT-IR image data are stored in 3D files that can be processed with the standard data pre-processing and evaluation functions inside OPUS.

Results of the evaluation are typically chemical images of the sample that can be displayed two- and three-dimensional in various false color scales. For the evaluation of the 3D data OPUS offers a large variety of algorithms like the integration of bands, the correlation with pure component spectra, the 3D cluster analysis, the Principal Component Analysis (PCA) and the calculation of RGB images.

To apply FT-IR imaging on larger samples the imaging macro chamber IMAC is available, which is equipped with a modern FPA detector similarly to the HYPERION 3000.

Pixel resolution in the HYPERION 3000 in transmission and reflectance:

Objective Pixel in resolution
15x 2.7 µm
20x 2.0 µm
36x 1.1 µm

More Information

Literature Room

Learn more about our FT-IR microscopes and solutions by downloading related literature.