XRM

3D XRM for Material Science

Bruker’s portfolio of 3D X-ray microscopes (XRM) offers turnkey solutions for non-destructive 3D imaging of a wide variety of industrial and scientific applications. This includes defect detection in casting, machining and additive manufacturing, inspection of complex electro-mechanical assemblies, pharmaceutical packaging, advanced medical tools, porosity and grain size analysis in geological samples, and in-situ microscopy.

A new dimension for microscopy

Bruker 3D X-ray Microscopes (XRM) combine micro-computed tomography (micro-ct) hardware with specialized software into a complete microscopic visualization solution. Ranging from micro-resolution benchtops to nano-resolution floor standing instruments, Bruker XRM solutions provide the perfect balance of ease-of-use and power.

From measuring the porosity in geological specimens to the thickness of multiple coatings on pharmaceutical tablets or the on-chip and board level interconnect structure of circuits, XRM allows rapid multiscale analysis. The non-destructive nature of XRM allows validation of component integrity bringing QC of manufacturing techniques such as additive manufacturing to a new level.

Bruker’s software provides simple push button interfaces for technicians and novice researchers and exceptional depth for experts looking to push the boundaries of their samples and the technique. Reconstruction is accomplished with the latest GPU driven algorithms providing results from large datasets in a fraction of the time. The included analysis package allows both qualitative visualizations and quantitative regressions.

Materials Science XRM Specifications

Specification

SKYSCAN 1275

SKYSCAN 1272 CMOS

SKYSCAN 1273

SKYSCAN 2214 CMOS

Exterior dimensions (w x d x h, mm)

1040 x 665 x 400

1160 x 520 x 330

1250 x 820 x 815

1800 x 950 x 1680

Weight (without optional electronics)

170 kg

150 kg

400 kg

1500 kg

Source

40-100 kV

40-100 kV

40-130 kV

20-160 kV

Detector

3 Mp Flat Panel

16 Mp CMOS

6 Mp Flat Panel

6 Mp  Flat Panel

16 Mp large CMOS

16 Mp mid CMOS

15 Mp hi-res CMOS

Max Sample Size (Diam, Height)

96 mm, 120 mm

75 mm, 80 mm

300 mm, 500 mm

300 mm, 400 mm

Minimum Resolution (Voxel, Spatial)

<4 µm, <8 µm

<0.45 µm, <5 µm

<3 µm, <6 µm

60 nm, <500 nm

Measurement, Reconstruction and Analysis Software

Included

Included

Included

Included

POSITION, SCAN, RECONSTRUCT…

Position

Real time view of the sample and actively updated default scan parameters allow fast scan setup.

Scan

Radiographs can be seen in real time allowing measurement monitoring. Measurements can be batched to ensure full system utilization.

NRECON

GPU driven, cutting edge algorithm results in 3D model reconstruction in a fraction of the traditional computing time.

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