TEM PicoIndenter Series

Hysitron PI 95

Quantitative nanomechanical testing inside our transmission electron microscope
Hysitron PI 95 TEM PicoIndenter

Lo más destacado

In-Situ Nanomechanical Test Instrument

Hysitron PI 95 TEM PicoIndenter

Bruker’s Hysitron PI 95 TEM PicoIndenter is the first full-fledged depth-sensing indenter capable of direct-observation nanomechanical testing inside a transmission electron microscope (TEM). With this side-entry instrument, it is not only possible to image the mechanical response of nanoscale materials, but also to acquire load-displacement data simultaneously. Further, an integrated video interface allows for time synchronization between the load-displacement curve and the corresponding TEM video.

Full-fledged
depth-sensing indenter
Enables direct-observation nanomechanical testing inside a transmission electron microscope.
Performech
advanced control module
Delivers a 78 kHz feedback rate and data acquisition up to 38 kHz to capture transient events, such as dislocation bursts.
Precise
tip-positioning and mechanical testing
Includes a three-axis positioner, 3D piezoelectric actuator, and advanced transducer for electrostatic actuation and capacitive displacement sensing.

Características

Customized Solution for Your TEM

The Hysitron PI 95 has been carefully designed for compatibility with JEOL, FEI, Hitachi, and Zeiss microscopes. With this instrument it is not only possible to image the mechanical response of nanoscale materials, but also acquire quantitative mechanical data simultaneously. The integrated video interface allows for synchronization between the load-displacement curve and the corresponding TEM video.

Optimized for Nanoscale Investigation

Dark-field TEM images of a Ni nanopillar before and after compression. The high dislocation density initially observed in the pillar has disappeared upon compression. Nature Materials 7, 115-119 (2007).

The Hysitron PI 95 is uniquely suited for the investigation of nanoscale phenomena. Performing these types of studies in the TEM can provide unambiguous differentiation between the many possible causes of force or displacement transients which may include dislocation bursts, phase transformations, spalling, shear banding or fracture onset.

Unparalleled Performance

An example 1 μN scratch test: (1) Normal and lateral loads and displacements versus time and (2-5) corresponding frames from the in-situ TEM video showing the buckling of the DLC film in advance of the tip and flattening of the asperities in the tops of the grains.

The Hysitron PI 95 utilizes three levels of control for tip positioning and mechanical testing. In addition to a three-axis coarse positioner and a 3D piezoelectric actuator for fine positioning, the instrument is equipped with a transducer for electrostatic actuation and capacitive displacement sensing for acquiring quantitative nanoscale mechanical data.

Webinars

Más información

Contacto con un experto

Contact Us

* Please fill out the mandatory fields.

Please enter your first name
Please enter your last name
Please enter your e-mail address
Please enter your Company/Institution
What best describes your current interest?
Please add me to your email subscription list so I can receive webinar invitations, product announcements and events near me.
Please accept the Terms and Conditions

Este sitio está protegido por reCAPTCHA y se aplican la Política de privacidad y las Condiciones del servicio de Google.