▶ Watch On-Demand | 53 Minutes

Using Nanoelectrical Solutions to Expand the Capability of AFM

Innovative nanoelectrical AFM modes provide a significant new capability for materials characterisation

Vous devez accepter les cookies pour lire cette video.

Presented by Peter De Wolf, Ph.D., Worldwide Application Director, Bruker Nano Surfaces & Metrology (March 29, 2018)

Featured Products and Technology

Dimension Icon

Proven highest performance and versatility in an easily tunable AFM platform — now available as IconIR-ready

DOWNLOAD BROCHURE

Dimension XR SPM

Dimension XR

Turnkey AFM systems that deliver unique, first-and-only modes and capabilities for advanced materials research

DOWNLOAD BROCHURE

Atomic Force Microscope Modes

AFM Modes

AFM modes and the broad capabilities from AFM beyond imaging

REQUEST MORE INFORMATION

RETURN TO SESSION OVERVIEW