The webinar looks at how AFM-based nanoelectrical measurement capability has advanced, how it is now more accessible to a wider range of materials and how the user can obtain a greater amount of information about their sample than has previously been possible. The properties which can be measured by current AFM instruments are compared to Bruker’s new state-of-the-art solution.
The webinar showcases how correlating nanomechanical and nanoelectrical measurements can lead to a greater determination of properties. It shows how Bruker’s new solution, the NanoElectrical Lab, can correlate both the mechanical and electrical data at each single pixel for an increased understanding of sample properties and an increase in the longevity of AFM tips.
The NanoElectrical Lab:
Overall, this webinar is tailored to those who already undertake electrical measurements, or are interested in it, as well as people who are already using existing techniques but require a higher resolution. In addition, it is of interest to people who already use AFM but not necessarily for nanoelectrical measurements. General microscopists who are interested in measuring properties at the nanometer scale would also be interested in this webinar.
Peter Dewolf, Ph.D.
Worldwide Application Director, Bruker Nano Surfaces & Metrology