In this webinar, Using Nanoelectrical Solutions to Expand the Capability of AFM, our speakers discuss:
In service of these points, current AFM instruments — and their materials characterisation capabilities — are compared to Bruker’s new state-of-the-art AFM modes solutions.
This webinar showcases how correlating nanomechanical and nanoelectrical measurements can lead to a greater determination of properties. Moreover, it demonstrates how Bruker’s new solution, the NanoElectrical Lab, can correlate both the mechanical and electrical data at each single pixel to provide an increased understanding of sample properties while also lengthening the usable lifespan of AFM tips.
During the session, the speakers explore the following topics:
About Bruker's NanoElectrical Lab
Nanoelectrical Applications of AFM Instruments
This webinar was presented on: March 29, 2018
Overall, this webinar is tailored to those who already undertake electrical measurements, or are interested in it, as well as people who are already using existing techniques but require a higher resolution. In addition, it is of interest to people who already use AFM but not necessarily for nanoelectrical measurements. General microscopists who are interested in measuring properties at the nanometer scale would also be interested in this webinar.
Dr. Peter De Wolf
Worldwide Director of Applications, Bruker