In this webinar, our speaker discusses how AFM-based nanoelectrical measurement capability has advanced. AFM is now more accessible to a wider range of materials and the user can obtain a greater amount of information about their sample than has previously been possible.
This webinar showcases how correlating nanomechanical and nanoelectrical measurements can lead to a greater determination of properties. The speaker demonstrates how Bruker’s new solution, the NanoElectrical Lab, can correlate both mechanical and electrical data at each single pixel to provide an increased understanding of sample properties while also lengthening the usable lifespan of AFM tips.
During the session, the speakers explore the following topics:
Bruker's NanoElectrical Lab
Nanoelectrical Applications of AFM Instruments
This webinar was presented on: March 29, 2018
Find out more more the featured AFM products and services in this webinar:
Peter Dewolf, Ph.D.
Worldwide Application Director, Bruker Nano Surfaces & Metrology