Atomic Force Microscopy Webinars

Using Nanoelectrical Solutions to Expand the Capability of AFM

Innovative nanoelectrical AFM modes provide a significant new capability for materials characterisation

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Learn About Innovative Nanoelectrical AFM Components & Applications

In this webinar, Using Nanoelectrical Solutions to Expand the Capability of AFM, our speakers discuss:

  1. How AFM-based nanoelectrical measurement capability has advanced;
  2. The ways that AFM is now more accessible to a wider range of materials; and
  3. How the user can obtain a greater amount of information about their sample than has previously been possible.

In service of these points, current AFM instruments — and their materials characterisation capabilities — are compared to Bruker’s new state-of-the-art AFM modes solutions.

Key Topics

This webinar showcases how correlating nanomechanical and nanoelectrical measurements can lead to a greater determination of properties. Moreover, it demonstrates how Bruker’s new solution, the NanoElectrical Lab, can correlate both the mechanical and electrical data at each single pixel to provide an increased understanding of sample properties while also lengthening the usable lifespan of AFM tips.

During the session, the speakers explore the following topics:

About Bruker's NanoElectrical Lab

  • Introduction to the NEW DataCube modes 
  • Correlation of nanomechanical and nanoelectrical data
  • Possibilities for tailored nanoelectrical measurements

Nanoelectrical Applications of AFM Instruments

  • Graphene and other 2D materials
  • Semiconductors
  • Nanowires
  • Ferro and piezo-electrics
  • Smart materials
  • Conductive polymers
  • Battery materials
  • Fuel Cells


If you have any questions about our products or services, please contact us. Follow @BrukerNano on Twitter for event, product, and webinar updates.

This webinar was presented on: March 29, 2018

Who Should Attend?

Overall, this webinar is tailored to those who already undertake electrical measurements, or are interested in it, as well as people who are already using existing techniques but require a higher resolution. In addition, it is of interest to people who already use AFM but not necessarily for nanoelectrical measurements. General microscopists who are interested in measuring properties at the nanometer scale would also be interested in this webinar.


Peter De Wolf, Ph.D.
Worldwide Application Director, Bruker Nano Surfaces & Metrology

Peter De Wolf received his Ph.D in Electrical Engineering from the University Leuven, Belgium in 1998. His PhD work focused on the development of SPM based electrical characterization methods for semiconductors at IMEC in Belgium. He is co-inventor of several SPM methods & holder of several patents. Since 1998, Peter De Wolf works at Bruker (formerly Digital Instruments & Veeco Instruments) in both Santa Barbara, USA and Paris, France. At Bruker he held positions as R&D engineer and application development scientist and contributed in the development of electrical SPM methods including SSRM, TUNA, SCM, and DataCube methods. Currently, he is Worldwide Director of Applications – leading an international team of experts in SPM with laboratories located in Europe, USA, Asia and Japan, covering a broad range of SPM applications and operating modes