Learn more about the use of s-SNOM to unravel chemical heterogeneity effecting functional properties in materials due to complex inter- and intra-molecular coupling of heterogeneous phases.
This webinar introduces scattering scanning nearfield optical microscopy (s-SNOM), which provides information about the complex optical properties of the nanoscale region of a sample under a metallized tip that nanofocuses optical radiation. Recent developments in novel methods, advanced light sources, and refined instrumentation have made s-SNOM more valuable and accessible.
Capabilities for s-SNOM are available on Bruker’s nanoIR3-s and nanoIR3-s Broadband platforms, and the technique itself was developed in collaboration with the webinar’s guest speaker, Professor Markus Raschke, Dept. of Physics/JILA, University of Colorado.
After a thorough and illustrative introduction to the method, Prof. Raschke presents his research efforts towards using s-SNOM, this new dimension in optical nanoprobe imaging, to access the functional properties of materials and systems including electronic materials, energy materials, nano-biomaterials, quantum systems, and more.
Following Prof. Raschke’s comprehensive presentation, he answers questions from the audience covering topics from the maximum sensitivity level of s-SNOM to the use of complementary AFM techniques with s-SNOM.
Find out more information about Bruker's solutions for AFM-IR Spectroscopy:
Dr. Markus Raschke
Department of Physics and Department of Chemistry, JILA, University of Colorado
Dr. Honghua Yang
Dr. Qichi Hu
Senior Applications Scientist
Dean Dawson, Senior Director, Business Manager - nanoIR, Bruker Nano