QUANTAX 80 is a new EDS system specially designed for the Hitachi FlexSEM1000 Microscope. QUANTAX 80 consists of a XFlash® silicon drift detector (SDD) with the best energy resolution in its field, a small electronics unit and an easy-to-use ESPRIT Compact software.
The system performs qualitative and quantitative analyses of all materials with an element range from boron (5) to californium (98). Besides composition analysis at individual spots on the sample surface, QUANTAX 80 provides powerful line scan and spectral element mapping functions. With the customized detector, the analysis and reporting is completed within seconds.