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고에너지 X-ray로 가볍고 무거운 원소를 빠르게 분석하십시오!
최대 6개의 필터를 선택하여 복잡한 시료에서 작은 피크를 측정할 수 있습니다!
특허받은 조리개 관리 시스템을 사용하여 지형 샘플을 스캔하십시오!
대형 스폿 크기 측정을 통해 분말을 정확하게 분석합니다!
전동식 소스 삽입 및 리트랙팅으로 분석 프로세스를 자동화하십시오!
In this webinar we will introduce you XTrace 2, a new X-ray source for micro-XRF on SEM which takes its analytical capabilities further than ever before.
XTrace 2 expands the capabilities of micro-XRF on SEM, allowing a wider variety of samples to be analyzed, such as topographic samples and inhomogeneous samples. Join us in this webinar to explore the potential of micro-XRF on SEM with XTrace 2 across a range of different applications.
The fourth webinar in our "Back to the Roots" Series, focusing on the fundamentals of micro-XRF.
This webinar demonstrates the benefits of having a micro-XRF source mounted on your SEM with examples from across a wide range of applications, incorporating both element distribution mapping as well as quantification, including trace elements.