XTrace 2 - The X-Ray Source for micro-XRF on SEM
50
W
X-ray tube power
Reduce your acquisition time with high-power X-ray generation
AMS
Aperture Management System
Scan topographic samples with an enhanced depth of field, and choose between 6 filters for further background reduction and increased trace element detection
Automated
Source Insertion and Retraction Mode
Automatically and safely insert and retract the X-ray optic source
XTrace 2 - The Latest X-Ray Source for Scanning Electron Microscopes
Analyze light and heavy elements quickly with high energy X-rays!
Determine small peaks in complex samples via selection of up to 6 filters!
Scan topographic samples using a patented Aperture Management System!
Accurately analyze powders via large spot size measurements!
Automate your analysis process with motorized source insertion and retraction!
XTrace 2 - Advanced X-Ray Source for micro-XRF on SEM
