Bruker webinar

Using Nanoelectrical Solutions to Expand the Capability of AFM

Innovative nanoelectrical AFM modes provide a significant new capability for materials characterization
This webinar took place on March 29th 2018

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Webinar Overview

The webinar looks at how AFM-based nanoelectrical measurement capability has advanced, how it is now more accessible to a wider range of materials and how the user can obtain a greater amount of information about their sample than has previously been possible. The properties which can be measured by current AFM instruments are compared to Bruker’s new state-of-the-art solution. 

The webinar showcases how correlating nanomechanical and nanoelectrical measurements can lead to a greater determination of properties. It shows how Bruker’s new solution, the NanoElectrical Lab, can correlate both the mechanical and electrical data at each single pixel for an increased understanding of sample properties and an increase in the longevity of AFM tips.

Key Topics

The NanoElectrical Lab:

  • Introduction to the NEW DataCube modes 
  • Correlation of nanomechanical and nanoelectrical data
  • Possibilities for tailored nanoelectrical measurements


Applications:

  • Graphene and other 2D materials
  • Semiconductors
  • Nanowires
  • Ferro and piezo-electrics
  • Smart materials
  • Conductive polymers
  • Battery materials
  • Fuel Cells

Who Should Watch?

Overall, this webinar is tailored to those who already undertake electrical measurements, or are interested in it, as well as people who are already using existing techniques but require a higher resolution. In addition, it is of interest to people who already use AFM but not necessarily for nanoelectrical measurements. General microscopists who are interested in measuring properties at the nanometer scale would also be interested in this webinar.

Speaker

Dr. Peter De Wolf
Dr. Peter De Wolf
Worldwide Director of Applications, Bruker
Peter De Wolf received his Ph.D in Electrical Engineering from the University Leuven, Belgium in 1998. His PhD work focused on the development of SPM based electrical characterization methods for semiconductors at IMEC in Belgium. He is co-inventor of several SPM methods & holder of several patents. Since 1998, Peter De Wolf works at Bruker (formerly Digital Instruments & Veeco Instruments) in both Santa Barbara, USA and Paris, France. At Bruker he held positions as R&D engineer and application development scientist and contributed in the development of electrical SPM methods including SSRM, TUNA, SCM, and DataCube methods. Currently, he is Worldwide Director of Applications – leading an international team of experts in SPM with laboratories located in Europe, USA, Asia and Japan, covering a broad range of SPM applications and operating modes.