Hysitron Instruments for Microscopes | Bruker

Quantitative Nanomechanics Enhanced with the Power of Microscopy

Bruker has developed a comprehensive suite of nanomechanical and nanotribological test instruments that operate in conjunction with powerful microscopy techniques. Combining the advantages of advanced microscopy technologies with quantitative in-situ nanomechanical characterization enables an accelerated understanding of material behavior at the nanoscale.

surface analysis
Hysitron PI 85L SEM PicoIndenter | Bruker

PI 85L SEM PicoIndenter

Depth-sensing nanomechanical test instrument that can be interfaced with scanning electron microscopes (SEM).

 

Hysitron PI 88 SEM PicoIndenter | Bruker

PI 88 SEM PicoIndenter

Bruker’s comprehensive nanomechanical test instrument for SEM and FIB/SEM, featuring our full suite of techniques.

 

Hysitron PI 95 TEM PicoIndenter | Bruker

PI 95 TEM PicoIndenter

The first full-fledged depth-sensing indenter capable of direct-observation nanomechanical testing inside a transmission electron microscope (TEM).

 

Hysitron IntraSpect 360 | Bruker

IntraSpect 360

Quantitative in-situ mechanical property characterization specifically designed for X-Ray microscopes (XRM) and beamlines.

Hysitron TS 75 TriboScope | Bruker

TS 75 TriboScope

Quantitative, rigid-probe nanoindentation and nanotribological characterization on your existing AFM.

Hysitron BioSoft In-Situ Indenter | Bruker

BioSoft In-Situ Indenter

The first of its kind instrument for multiscale quantitative mechanical testing of biological materials and hydrogels.