Anasys IR3 webslider 2018.065

2D Materials Characterization with nanoIR Spectroscopy

2D materials and nanophotonics provide an exciting area of materials research and development for a wide range of new applications. The nanoIR3-s scattering SNOM platform provides unique capabilities to characterize the nanoscale optical, chemical and material properties of a broad range of novel 2D and quantum materials. Applications include:

  • Plasmonics and surface polaritons
  • 2D materials including graphene
  • Nanophotonics
  • Optical antennas
  • Nanoscale optical properties

hBN Phonon-polaritons

HBN Phonon polaritons 2

Nano imaging of surface phonon polaritons (SPhP) on hexagonal boron nitride (hBN). (a) AFM height image showing homogeneous hBN surface with different layers on Si substrate; (b) s-SNOM amplitude showing strong interference fringes due to propagating SPhP along the surface on hBN; (c) s-SNOM phase showing a difference phase with alternating layer thicknesses. Images (b) and (c) show the changing wavelengths of the SPhP across the layers.

Graphene Plasmonics

Graphene Plasmons Ill

s-SNOM phase and amplitude images of surface plasmon polariton (SPP) on a graphene wedge. 3D view phase image (left), s-SNOM phase image (center) with a line cross-section of the SPP standing wave, and s-SNOM amplitude image (right).

2D Metamaterials

Chirality 3d

Combine S-SNOM and AFM-IR to create remarkable new data: Complementary AFM-IR and Scattering SNOM images reveal, for the first time, the microscale origins of optical chirality on plasmonics structures. By accessing both the radiative (s-SNOM) and non-radiative (AFM-IR) information on plasmonics structures, unique and complementary plasmonic properties can be obtained. Khanikaev et al., Nat. Comm. 7, 12045 (‘16). Doi:10.1038/ncomms12045


NanoAntannaeData 1

nanoIR3-s provides s-SNOM amplitude (bottom); s-SNOM phase (top) NanoIR3-s using s-SNOM mode with POINTspectra CW QCL laser source 

Organolead Triiodide Perovskites

Organolead Triiodide Perovskites

AFM-IR spectra and images of a solution-processed CH3NH3PbI3 photodetector collected as deposited (c,d) and after annealing at 140° C (e,f). Height images (top row) and corresponding AFM-IR images (bottom row). Images courtesy of Dong, R., Fang, et al, (2015), Adv. Mater., 27: 1912–1918

Nano FTIR Spectroscopy

PTFI spectrograph group Vertical

Ultrafast-broadband scattering SNOM spectroscopy probing molecular vibrational information. Laser interferogram of Polytetrafluoroethylene (PTFE) shows coherent molecular vibration in the form of free-induction decay in time domain (top). The highlighted feature in sample interferogram is due to the beating of symmetric and antisymmetric mode of C-F modes in the resulting the frequency domain (bottom left). Monolayer sensitivity of nano-FTIR is demonstrated on a monolayer pNTP (bottom right). Data courtesy of Prof. Markus Raschke, University of Colorado, Boulder, US.

s-SNOM Imaging of Multilayer Nylon and PE Sample

s-SNOM can be used to measured multi-layer polymeric films . Here absorption bands at 1640 and 1540 cm-1 were observed for nylon. Subsequent s-SNOM imaging at 1640 cm-1 showed contrast between the nylon layer and PE layer. Sample provided courtesy of DSM.

AFM Height

Multi LayerNylon height 2 300x171

s-SNOM Absorption (1692cm-1)

Multi LayerNylon absorption 2 300x175

s-SNOM Absoprtion (1640cm-1)

Multi LayerNylon absorption1640 3 300x165

s-SNOM Absorption (Black) and Reflection (Blue) Spectrum

Multi LayerNylon spectrum 2 300x227