作为纳米力学测试系统的全球领导者,布鲁克的 Hysitron PI Series PicoIndenters 可助您轻松在显微镜下进行原位纳米力学实验。布鲁克独有的传感器设计在整个实验过程中为您提供超强的稳定性,即使在纳米级也能获得精确的数据。从显微镜拍摄的视频可实现实时监测实验进程,并将力学数据与显微成像直接关联起来。此外,与众多主流显微镜品牌兼容的设计,可确保您能找到与您的研究完美匹配的解决方案。
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纳米压痕
准确的水平定位和纳米尺度的载荷及位移控制,实现多种不同材料基础力学性质的定量检测,如硬度、模量等。
拉伸测试
直接拉伸和压转拉测试可以用在包括狗骨头样品、薄膜或者纳米线应力应变行为的原位测量。这些低维材料难以在用传统方法测量。
弯曲测试
通过扫描电镜成像功能实现样品精确定位和样品尺寸测量,从而能直接测量单一相区、聚合物和多层材料的弯曲刚度和断裂韧性等。
压缩测试
可以压缩微柱、颗粒和其它小尺寸材料来测量应力应变行为和屈服特性,同时实时观察变形行为。还可以通过扫描电镜成像来确定探针针尖位置。
In-situ nanoindentation is a technique that measures mechanical properties (such as hardness, modulus, fracture, and creep) at the nanoscale while observing deformation in real time inside an SEM or TEM, or with an optical microscope.
In-situ nanoindentation is suitable for metals, ceramics, polymers, thin films, coatings, biological materials, and nanostructures, such as nanowires and MEMS devices.
This depends on the systems and transducer technology. Bruker PI Envision SEM PicoIndenter offers load range up to 250 mN and displacement to 150 μm, while PI 89 offers max load to 3.5 N and max displacement to 150 μm.
Yes, with the appropriate heating or cooling stages, nanoindentation can be performed at high temperatures or cryogenic conditions. Bruker’s Hysitron PI 85 and Envision offer a temperature range of room temperature to 800°C, whereas PI 89 has a range of -150°C to 1000°C.
Yes, advanced systems such as the Bruker PI 89 support high strain rate (>104 1/s) testing across different temperature conditions.
The force-displacement curve is analyzed to determine hardness, modulus, creep, fracture toughness, and other material properties. Models such as the Oliver-Pharr method are commonly used.
It allows direct observation of crack initiation, fracture behavior, and plastic deformation mechanisms under controlled loading.
Bruker offers TriboScan and Tribo iQ software solutions for data acquisition, test control, and large-scale data analysis. Find out more about Tribo iQ here.
Yes, Bruker’s Hysitron PicoIndenters provide a unique solution for capturing and synchronizing mechanical data collection and video capture from the SEM computer. For more detail about this technique, please contact us.
Bruker offers Push-to-Pull (PTP) and Electrical Push-to-Pull (E-PTP) devices for nano-structure characterization.
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